Accurate secondary ion mass spectrometry analysis of shallow doping profiles in Si based on the internal standard method

1996 ◽  
Vol 14 (1) ◽  
pp. 324 ◽  
Author(s):  
G. L. Liu
Keyword(s):  
Mass Spectrometry ◽  
Standard Method ◽  
Secondary Ion Mass Spectrometry ◽  
Internal Standard ◽  
Mass Spectrometry Analysis ◽  
Internal Standard Method ◽  
Spectrometry Analysis ◽  
Ion Mass Spectrometry ◽  
Doping Profiles ◽  
Secondary Ion

Calculation of Membrane Lipid Ratios Using Single-Pixel Time-of-Flight Secondary Ion Mass Spectrometry Analysis

2015 ◽  
Vol 87 (15) ◽  
pp. 7795-7802 ◽  
Author(s):  
Rainer Kassenböhmer ◽  
Felix Draude ◽  
Martin Körsgen ◽  
Andreas Pelster ◽  
Heinrich F. Arlinghaus
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
Membrane Lipid ◽  
Mass Spectrometry Analysis ◽  
Spectrometry Analysis ◽  
Lipid Ratios ◽  
Ion Mass Spectrometry ◽  
Secondary Ion ◽  
Single Pixel
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