Applications of in situ ellipsometry to microwave electron cyclotron resonance plasma processes

1993 ◽  
Vol 11 (4) ◽  
pp. 1786-1791 ◽  
Author(s):  
Y. Z. Hu ◽  
J. Joseph ◽  
E. A. Irene
1995 ◽  
Vol 66 (11) ◽  
pp. 5252-5256 ◽  
Author(s):  
Patrick O’Keeffe ◽  
C. O’Morain ◽  
S. Den ◽  
Y. Hayashi ◽  
S. Komuro ◽  
...  

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