An In-Situ Spectroscopic Ellipsometry Study of the Electron Cyclotron Resonance Plasma Oxidation of Silicon and Interfacial
1996 ◽
Vol 14
(3)
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pp. 1687
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1992 ◽
Vol 10
(6)
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pp. 2711
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1992 ◽
Vol 10
(2)
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pp. 611
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1994 ◽
Vol 33
(Part 2, No. 9A)
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pp. L1248-L1250
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1993 ◽
Vol 11
(4)
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pp. 1786-1791
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1994 ◽
Vol 12
(2)
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pp. 540
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2006 ◽
Vol 45
(9B)
◽
pp. 7351-7353
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