In situ investigation of temperature and bias dependent effects on the oxide growth of Si and Ge in an electron cyclotron resonance
1993 ◽
Vol 11
(4)
◽
pp. 900-904
◽
1996 ◽
Vol 14
(3)
◽
pp. 1687
◽
1997 ◽
Vol 241-243
◽
pp. 1217-1221
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Keyword(s):
2000 ◽
Vol 9
(3-6)
◽
pp. 573-576
◽
1992 ◽
Vol 10
(6)
◽
pp. 2711
◽
Keyword(s):
1997 ◽
Vol 121-122
◽
pp. 228-232
◽
1993 ◽
Vol 11
(4)
◽
pp. 1786-1791
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