An Efficient Technique for Leakage Current Estimation in Sub 65nm Scaled CMOS Circuits Based on Loading Effect
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2010 ◽
Vol 59
(7)
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pp. 922-932
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1987 ◽
Vol 34
(1)
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pp. 101-106
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2004 ◽
Vol 51
(9)
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pp. 1455-1462
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