An Efficient Technique for Leakage Current Estimation in Sub 65nm Scaled CMOS Circuits Based on Loading Effect

Author(s):  
Ashesh Rastogi ◽  
Wei Chen ◽  
Alodeep Sanyal ◽  
Sandip Kundu
2006 ◽  
Vol 2 (1) ◽  
pp. 87-94
Author(s):  
P. Ruiz-de-Clavijo ◽  
J. Juan-Chico ◽  
M. J. Bellido ◽  
A. Millán ◽  
D. Guerrero ◽  
...  

2004 ◽  
Vol 51 (9) ◽  
pp. 1455-1462 ◽  
Author(s):  
F. Stellari ◽  
P. Song ◽  
J.C. Tsang ◽  
M.K. McManus ◽  
M.B. Ketchen

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