An Efficient Technique for Leakage Current Estimation in Nanoscaled CMOS Circuits Incorporating Self-Loading Effects
2010 ◽
Vol 59
(7)
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pp. 922-932
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2004 ◽
Vol 51
(9)
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pp. 1455-1462
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2004 ◽
Vol 39
(1)
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pp. 157-168
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2007 ◽
Vol 15
(7)
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pp. 758-766
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Keyword(s):
2004 ◽
Vol 19
(5)
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pp. 708-717
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