An Efficient Technique for Leakage Current Estimation in Nanoscaled CMOS Circuits Incorporating Self-Loading Effects

2010 ◽  
Vol 59 (7) ◽  
pp. 922-932 ◽  
Author(s):  
Alodeep Sanyal ◽  
Ashesh Rastogi ◽  
Wei Chen ◽  
Sandip Kundu
2006 ◽  
Vol 2 (1) ◽  
pp. 87-94
Author(s):  
P. Ruiz-de-Clavijo ◽  
J. Juan-Chico ◽  
M. J. Bellido ◽  
A. Millán ◽  
D. Guerrero ◽  
...  

2004 ◽  
Vol 51 (9) ◽  
pp. 1455-1462 ◽  
Author(s):  
F. Stellari ◽  
P. Song ◽  
J.C. Tsang ◽  
M.K. McManus ◽  
M.B. Ketchen

2004 ◽  
Vol 19 (5) ◽  
pp. 708-717 ◽  
Author(s):  
Yong-Jun Xu ◽  
Zu-Ying Luo ◽  
Xiao-Wei Li ◽  
Li-Jian Li ◽  
Xian-Long Hong

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