Low-Temperature Growth (400<tex>$^circhboxC$</tex>) of High-Integrity Thin Silicon–Oxynitride Films by Microwave-Excited High-Density Kr–O<tex>$_2$</tex>–<tex>$hboxNH_3$</tex>Plasma
2004 ◽
Vol 32
(4)
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pp. 1747-1751
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2004 ◽
Vol 7
(4)
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pp. G62
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1995 ◽
Vol 34
(Part 1, No. 2B)
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pp. 900-902
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