Ultra‐low‐temperature growth of high‐integrity gate oxide films by low‐energy ion‐assisted oxidation
Keyword(s):
1995 ◽
Vol 34
(Part 1, No. 2B)
◽
pp. 900-902
◽
Keyword(s):
Keyword(s):
Keyword(s):
Keyword(s):
2000 ◽
Vol 61
(23)
◽
pp. 16137-16143
◽
Keyword(s):
Keyword(s):
2004 ◽
Vol 109
(1-3)
◽
pp. 131-135
◽
Keyword(s):
1998 ◽
pp. 139-142
Keyword(s):