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scholarly journals On Delay Test Quality for Test Cubes

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Seiji Kajihara ◽  
Yasuo Sato ◽  
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Xiaoqing Wen
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scholarly journals Estimation of Delay Test Quality and Its Application to Test Generation

2008 ◽  
Vol 1 ◽  
pp. 104-115 ◽  
Author(s):  
Seiji Kajihara ◽  
Shohei Morishima ◽  
Masahiro Yamamoto ◽  
Xiaoqing Wen ◽  
Masayasu Fukunaga ◽  
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Delay Test ◽  
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scholarly journals Logic Design for On-Chip Test Clock Generation - Implementation Details and Impact on Delay Test Quality

2005 ◽  
Author(s):  
M. Beck ◽  
O. Barondeau ◽  
M. Kaibel ◽  
F. Poehl ◽  
Xijiang Lin ◽  
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Keyword(s):  
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Delay Test ◽  
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Harzard-Based ATPG for Improving Delay Test Quality

2015 ◽  
Vol 31 (1) ◽  
pp. 27-34 ◽  
Author(s):  
Tieqiao Liu ◽  
Yingbo Zhou ◽  
Yi Liu ◽  
Shuo Cai
Keyword(s):  
Delay Test ◽  
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Estimation of delay test quality and its application to test generation

2007 ◽  
Author(s):  
Seiji Kajihara ◽  
Shohei Morishima ◽  
Masahiro Yamamoto ◽  
Xiaoqing Wen ◽  
Masayasu Fukunaga ◽  
...  
Keyword(s):  
Test Generation ◽  
Delay Test ◽  
Test Quality
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