2010 IEEE International Test Conference
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9781424472062
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Parity prediction synthesis for nano-electronic gate designs

2010 ◽  
Author(s):  
D. A. Tran ◽  
A. Virazel ◽  
A. Bosio ◽  
L. Dilillo ◽  
P. Girard ◽  
...  

Mining AC delay measurements for understanding speed-limiting paths

2010 ◽  
Author(s):  
Janine Chen ◽  
Brendon Bolin ◽  
Li-C. Wang ◽  
Jing Zeng ◽  
Dragoljub Drmanac ◽  
...  

Constrained ATPG for functional RTL circuits using F-Scan

2010 ◽  
Author(s):  
Marie Engelene J. Obien ◽  
Satoshi Ohtake ◽  
Hideo Fujiwara

Detecting and diagnosing open defects

2010 ◽  
Author(s):  
Dat Tran ◽  
LeRoy Winemberg ◽  
Darrell Carder ◽  
Xijiang Lin ◽  
Joe LeBritton ◽  
...  
Keyword(s):  
Open Defects

A high linearity compact timing vernier for CMOS timing generator

2010 ◽  
Author(s):  
Jun Kohno ◽  
Tatsuro Akiyama ◽  
Dai Kato ◽  
Makoto Imamura
Keyword(s):  
High Linearity

Rapid FPGA delay characterization using clock synthesis and sparse sampling

2010 ◽  
Author(s):  
Mehrdad Majzoobi ◽  
Eva Dyer ◽  
Ahmed Elnably ◽  
Farinaz Koushanfar
Keyword(s):  
Sparse Sampling
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