2010 15th IEEE European Test Symposium
Latest Publications

TOTAL DOCUMENTS

72

(FIVE YEARS 0)

H-INDEX

9

(FIVE YEARS 0)

Published By IEEE

9781424458349

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

A multi-mode MEMS sensor design to support system test and health & usage monitoring applications

2010 15th IEEE European Test Symposium ◽

10.1109/etsym.2010.5512728 ◽

2010 ◽

Author(s):

Z. Xu ◽

A. Richardson ◽

L. Li ◽

M. Begbie ◽

D. Koltsov ◽

...

Keyword(s):

Support System ◽

Sensor Design ◽

Mems Sensor ◽

Monitoring Applications ◽

Multi Mode

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A diagnostic test generation system and a coverage metric

2010 15th IEEE European Test Symposium ◽

10.1109/etsym.2010.5512739 ◽

2010 ◽

Cited By ~ 2

Author(s):

Yu Zhang ◽

Vishwani D. Agrawal

Keyword(s):

Diagnostic Test ◽

Test Generation ◽

Generation System

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New scan-based test strategy for a dependable many-core processor using a NoC as a Test Access Mechanism

2010 15th IEEE European Test Symposium ◽

10.1109/etsym.2010.5512748 ◽

2010 ◽

Cited By ~ 1

Author(s):

Xiao Zhang ◽

Hans G. Kerkhoff ◽

Bart Vermeulen

Keyword(s):

Test Strategy ◽

Test Access Mechanism ◽

Many Core

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Hybrid test application in hybrid delay scan design

2010 15th IEEE European Test Symposium ◽

10.1109/etsym.2010.5512744 ◽

2010 ◽

Author(s):

Yuki Yoshikawa ◽

Tomomi Nuwa ◽

Hideyuki Ichihara ◽

Tomoo Inoue

Keyword(s):

Scan Design ◽

Test Application ◽

Hybrid Test

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Multiple fault diagnosis in crossbar nano-architectures

2010 15th IEEE European Test Symposium ◽

10.1109/etsym.2010.5512774 ◽

2010 ◽

Cited By ~ 3

Author(s):

Navid Farazmand ◽

Mehdi B. Tahoori

Keyword(s):

Fault Diagnosis ◽

Multiple Fault ◽

Multiple Fault Diagnosis

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Add-on blocks and algorithms for improving stimulus compression

2010 15th IEEE European Test Symposium ◽

10.1109/etsym.2010.5512746 ◽

2010 ◽

Author(s):

Nader Alawadhi ◽

Ozgur Sinanoglu ◽

Mohammed Al-Mulla

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Novel built-in methodology for defect testing of capacitor oxide in SAR analog to digital converters for critical automotive applications

2010 15th IEEE European Test Symposium ◽

10.1109/etsym.2010.5512762 ◽

2010 ◽

Cited By ~ 1

Author(s):

V. Malandruccolo ◽

M. Ciappa ◽

W. Fichtner ◽

H. Rothleitner

Keyword(s):

Analog To Digital Converters ◽

Automotive Applications ◽

Analog To Digital

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On measurement uncertainty of ADC nonlinearities in oscillation-based test

2010 15th IEEE European Test Symposium ◽

10.1109/etsym.2010.5512750 ◽

2010 ◽

Author(s):

Peter Mrak ◽

Anton Biasizzo ◽

Franc Novak

Keyword(s):

Measurement Uncertainty

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Adaptive test directions

2010 15th IEEE European Test Symposium ◽

10.1109/etsym.2010.5512789 ◽

2010 ◽

Cited By ~ 6

Author(s):

Peter Maxwell

Keyword(s):

Adaptive Test

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Sensors for built-in alternate RF test

2010 15th IEEE European Test Symposium ◽

10.1109/etsym.2010.5512783 ◽

2010 ◽

Cited By ~ 33

Author(s):

Louay Abdallah ◽

Haralampos-G. Stratigopoulos ◽

Christophe Kelma ◽

Salvador Mir

Keyword(s):

Rf Test

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