scholarly journals Estimation of Delay Test Quality and Its Application to Test Generation

2008 ◽  
Vol 1 ◽  
pp. 104-115 ◽  
Author(s):  
Seiji Kajihara ◽  
Shohei Morishima ◽  
Masahiro Yamamoto ◽  
Xiaoqing Wen ◽  
Masayasu Fukunaga ◽  
...  
Keyword(s):  
Test Generation ◽  
Delay Test ◽  
Test Quality

Estimation of delay test quality and its application to test generation

2007 ◽  
Author(s):  
Seiji Kajihara ◽  
Shohei Morishima ◽  
Masahiro Yamamoto ◽  
Xiaoqing Wen ◽  
Masayasu Fukunaga ◽  
...  
Keyword(s):  
Test Generation ◽  
Delay Test ◽  
Test Quality

scholarly journals On Delay Test Quality for Test Cubes

2010 ◽  
Vol 3 ◽  
pp. 283-291
Author(s):  
Shinji Oku ◽  
Seiji Kajihara ◽  
Yasuo Sato ◽  
Kohei Miyase ◽  
Xiaoqing Wen
Keyword(s):  
Delay Test ◽  
Test Quality

scholarly journals Efficient Path Delay Test Generation for Custom Designs

ETRI Journal ◽  
2001 ◽  
Vol 23 (3) ◽  
pp. 138-150 ◽  
Author(s):  
Sungho Kang Kang ◽  
Bill Underwood Underwood ◽  
Wai-On Law Law ◽  
Haluk Konuk Konuk
Keyword(s):  
Test Generation ◽  
Path Delay ◽  
Delay Test ◽  
Path Delay Test

Deriving logic systems for path delay test generation

1998 ◽  
Vol 47 (8) ◽  
pp. 829-846 ◽  
Author(s):  
S. Bose ◽  
P. Agrawal ◽  
V.D. Agrawal
Keyword(s):  
Test Generation ◽  
Path Delay ◽  
Delay Test ◽  
Logic Systems ◽  
Path Delay Test
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