On using IEEE P1500 SECT for test plug-n-play

Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159) ◽

10.1109/test.2000.894273 ◽

2002 ◽

Cited By ~ 46

Author(s):

E.J. Marinissen ◽

R. Kapur ◽

Y. Zorian

Keyword(s):

Ieee P1500

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On IEEE P1500’s Standard for Embedded Core Test

SOC (System-on-a-Chip) Testing for Plug and Play Test Automation - Frontiers in Electronic Testing ◽

10.1007/978-1-4757-6527-4_1 ◽

2002 ◽

pp. 1-19 ◽

Cited By ~ 3

Author(s):

Erik Jan Marinissen ◽

Rohit Kapur ◽

Maurice Lousberg ◽

Teresa McLaurin ◽

Mike Ricchetti ◽

...

Keyword(s):

Ieee P1500

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Test requirements for embedded core-based systems and IEEE P1500

Proceedings International Test Conference 1997 ◽

10.1109/test.1997.639613 ◽

2002 ◽

Cited By ~ 82

Author(s):

Y. Zorian

Keyword(s):

Test Requirements ◽

Ieee P1500

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Design of on-line testing for SoC with IEEE P1500 compliant cores using reconfigurable hardware and scan shift

11th IEEE International On-Line Testing Symposium ◽

10.1109/iolts.2005.22 ◽

2005 ◽

Cited By ~ 4

Author(s):

K. Katoh ◽

A. Doumar ◽

H. Ito

Keyword(s):

Reconfigurable Hardware ◽

On Line ◽

Ieee P1500

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A unified DFT architecture for use with IEEE 1149.1 and VSIA/IEEE P1500 compliant test access controllers

Proceedings of the 38th Design Automation Conference (IEEE Cat. No.01CH37232) ◽

10.1109/dac.2001.935476 ◽

2002 ◽

Author(s):

B.I. Dervisoglu

Keyword(s):

Ieee 1149.1 ◽

Ieee P1500

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Efficient diagnosable design of the IEEE P1500 architecture for SoC testing

2011 IEEE 2nd International Conference on Networked Embedded Systems for Enterprise Applications ◽

10.1109/nesea.2011.6144939 ◽

2011 ◽

Cited By ~ 2

Author(s):

Hsin-Chou Chi ◽

Hsi-Che Tseng ◽

Chih-Ling Yang

Keyword(s):

Soc Testing ◽

Ieee P1500

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ETM10 incorporates hardware segment of IEEE P1500

IEEE Design & Test of Computers ◽

10.1109/mdt.2002.1003778 ◽

2002 ◽

Vol 19 (3) ◽

pp. 6-11 ◽

Cited By ~ 9

Author(s):

T. McLaurin ◽

S. Ghosh

Keyword(s):

Ieee P1500

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Overview of the ieee P1500 standard

International Test Conference, 2003. Proceedings. ITC 2003. ◽

10.1109/test.2003.1271086 ◽

2004 ◽

Cited By ~ 32

Author(s):

F. DaSilva ◽

Y. Zorian ◽

L. Whetsel ◽

K. Arabi ◽

R. Kapur

Keyword(s):

Ieee P1500

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IEEE P1500-compliant test wrapper design for hierarchical cores

2004 International Conferce on Test ◽

10.1109/test.2004.1387393 ◽

2005 ◽

Cited By ~ 19

Author(s):

A. Sehgal ◽

S.K. Goel ◽

E.J. Marinissen ◽

K. Chakrabarty

Keyword(s):

Test Wrapper ◽

Ieee P1500

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A unified DFT architecture for use with IEEE 1149.1 and VSIA/IEEE P1500 compliant test access controllers

Proceedings of the 38th Design Automation Conference (IEEE Cat. No.01CH37232) ◽

10.1145/378239.378280 ◽

2001 ◽

Cited By ~ 8

Author(s):

Bulent I. Dervisoglu

Keyword(s):

Ieee 1149.1 ◽

Ieee P1500

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TESTLINE: an IEEE P1500 compatible test scheme for SoC test

2003 5th International Conference on ASIC Proceedings (IEEE Cat No 03TH8690) ICASIC-03 ◽

10.1109/icasic.2003.1277553 ◽

2003 ◽

Author(s):

He Hu ◽

Sun Yihe

Keyword(s):

Test Scheme ◽

Soc Test ◽

Ieee P1500

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