IEEE P1500-compliant test wrapper design for hierarchical cores

2004 International Conferce on Test ◽

10.1109/test.2004.1387393 ◽

2005 ◽

Cited By ~ 19

Author(s):

A. Sehgal ◽

S.K. Goel ◽

E.J. Marinissen ◽

K. Chakrabarty

Keyword(s):

Test Wrapper ◽

Ieee P1500

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Test wrapper concepts and implementations

10.1049/ic:20000414 ◽

2000 ◽

Author(s):

D. Downey

Keyword(s):

Test Wrapper

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On IEEE P1500’s Standard for Embedded Core Test

SOC (System-on-a-Chip) Testing for Plug and Play Test Automation - Frontiers in Electronic Testing ◽

10.1007/978-1-4757-6527-4_1 ◽

2002 ◽

pp. 1-19 ◽

Cited By ~ 3

Author(s):

Erik Jan Marinissen ◽

Rohit Kapur ◽

Maurice Lousberg ◽

Teresa McLaurin ◽

Mike Ricchetti ◽

...

Keyword(s):

Ieee P1500

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Book Reviews: A guide for the wrapper perplexed [a review of The Core Test Wrapper Handbook by da Silva et al.; 2006)

IEEE Design & Test of Computers ◽

10.1109/mdt.2009.139 ◽

2009 ◽

Vol 26 (6) ◽

pp. 98-99

Author(s):

Scott Davidson

Keyword(s):

The Core ◽

Test Wrapper

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3D Test Wrapper Chain Optimization with I/O Cells Binding Considered

2019 International 3D Systems Integration Conference (3DIC) ◽

10.1109/3dic48104.2019.9058794 ◽

2019 ◽

Author(s):

Fan-Hsuan Tang ◽

Hsu-Yu Kao ◽

Shih-Hsu Huang ◽

Jin-Fu Li

Keyword(s):

Test Wrapper

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A randomization test wrapper for synthesizing single-case experiments using multilevel models: A Monte Carlo simulation study

Behavior Research Methods ◽

10.3758/s13428-019-01266-6 ◽

2019 ◽

Vol 52 (2) ◽

pp. 654-666 ◽

Cited By ~ 1

Author(s):

Bart Michiels ◽

René Tanious ◽

Tamal Kumar De ◽

Patrick Onghena

Keyword(s):

Monte Carlo Simulation ◽

Monte Carlo ◽

Simulation Study ◽

Multilevel Models ◽

Single Case ◽

Randomization Test ◽

Monte Carlo Simulation Study ◽

Test Wrapper

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Test-wrapper optimization for embedded cores in TSV-based three-dimensional SOCs

2009 IEEE International Conference on Computer Design ◽

10.1109/iccd.2009.5413172 ◽

2009 ◽

Cited By ~ 33

Author(s):

Brandon Noia ◽

Krishnendu Chakrabarty ◽

Yuan Xie

Keyword(s):

Three Dimensional ◽

Embedded Cores ◽

Test Wrapper

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Test wrapper algorithm for scan chain balance based on entropy increase hybrid differential evolution

2017 13th IEEE International Conference on Electronic Measurement & Instruments (ICEMI) ◽

10.1109/icemi.2017.8265766 ◽

2017 ◽

Author(s):

Deng Libao ◽

Zhang Baoquan ◽

Wang Sha ◽

Qiao Liyan

Keyword(s):

Differential Evolution ◽

Entropy Increase ◽

Scan Chain ◽

Test Wrapper

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Test requirements for embedded core-based systems and IEEE P1500

Proceedings International Test Conference 1997 ◽

10.1109/test.1997.639613 ◽

2002 ◽

Cited By ~ 82

Author(s):

Y. Zorian

Keyword(s):

Test Requirements ◽

Ieee P1500

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Design of Test Wrapper Scan Chain Based on Differential Evolution

Journal of Engineering Science and Technology Review ◽

10.25103/jestr.062.03 ◽

2013 ◽

Vol 6 (2) ◽

pp. 10-14

Author(s):

Aijun Zhu ◽

◽

Zhi Li ◽

Wangchun Zhu ◽

Chuanpei Xu ◽

...

Keyword(s):

Differential Evolution ◽

Scan Chain ◽

Test Wrapper

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Core Test Wrapper Design for Unicast and Multicast NOC Testing

Information Technology Journal ◽

10.3923/itj.2013.8242.8248 ◽

2013 ◽

Vol 12 (24) ◽

pp. 8242-8248

Author(s):

Zhang Ying ◽

Wu Ning ◽

Ge Fen ◽

Chen Xin

Keyword(s):

Test Wrapper

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