SOC (System-on-a-Chip) Testing for Plug and Play Test Automation - Frontiers in Electronic Testing
Latest Publications

TOTAL DOCUMENTS

(FIVE YEARS 0)

H-INDEX

(FIVE YEARS 0)

Published By Springer US

9781441953070, 9781475765274

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

The Role of Test Protocols in Automated Test Generation for Embedded-Core-Based System ICs

SOC (System-on-a-Chip) Testing for Plug and Play Test Automation - Frontiers in Electronic Testing ◽

10.1007/978-1-4757-6527-4_5 ◽

2002 ◽

pp. 71-90 ◽

Cited By ~ 3

Author(s):

Erik Jan Marinissen

Keyword(s):

Test Generation ◽

Automated Test Generation ◽

Automated Test

Download Full-text

On IEEE P1500’s Standard for Embedded Core Test

SOC (System-on-a-Chip) Testing for Plug and Play Test Automation - Frontiers in Electronic Testing ◽

10.1007/978-1-4757-6527-4_1 ◽

2002 ◽

pp. 1-19 ◽

Cited By ~ 3

Author(s):

Erik Jan Marinissen ◽

Rohit Kapur ◽

Maurice Lousberg ◽

Teresa McLaurin ◽

Mike Ricchetti ◽

...

Keyword(s):

Ieee P1500

Download Full-text

An Integrated Framework for the Design and Optimization of SOC Test Solutions

SOC (System-on-a-Chip) Testing for Plug and Play Test Automation - Frontiers in Electronic Testing ◽

10.1007/978-1-4757-6527-4_2 ◽

2002 ◽

pp. 21-36 ◽

Cited By ~ 7

Author(s):

Erik Larsson ◽

Zebo Peng ◽

Krishnendu Chakrabarty

Keyword(s):

Integrated Framework ◽

Design And Optimization ◽

Soc Test

Download Full-text

Deterministic Test Vector Compression/Decompression for Systems-on-a-Chip Using an Embedded Processor

SOC (System-on-a-Chip) Testing for Plug and Play Test Automation - Frontiers in Electronic Testing ◽

10.1007/978-1-4757-6527-4_9 ◽

2002 ◽

pp. 139-150 ◽

Cited By ~ 5

Author(s):

Abhijit Jas ◽

Nur A. Touba ◽

Krishnendu Chakrabarty

Keyword(s):

Test Vector ◽

Embedded Processor ◽

Test Vector Compression

Download Full-text

CAS-BUS: A Test Access Mechanism and a Toolbox Environment for Core-Based System Chip Testing

SOC (System-on-a-Chip) Testing for Plug and Play Test Automation - Frontiers in Electronic Testing ◽

10.1007/978-1-4757-6527-4_6 ◽

2002 ◽

pp. 91-109 ◽

Cited By ~ 2

Author(s):

Mounir Benabdenbi ◽

Walid Maroufi ◽

Meryem Marzouki ◽

Krishnendu Chakrabarty

Keyword(s):

Test Access Mechanism ◽

Chip Testing

Download Full-text

A Novel Reconfigurable Wrapper for Testing of Embedded Core-Based SOCs and its Associated Scheduling Algorithm

SOC (System-on-a-Chip) Testing for Plug and Play Test Automation - Frontiers in Electronic Testing ◽

10.1007/978-1-4757-6527-4_4 ◽

2002 ◽

pp. 51-70 ◽

Cited By ~ 2

Author(s):

Sandeep Koranne ◽

Krishnendu Chakrabarty

Keyword(s):

Scheduling Algorithm

Download Full-text

Signal Integrity: Fault Modeling and Testing in High-Speed SoCs

SOC (System-on-a-Chip) Testing for Plug and Play Test Automation - Frontiers in Electronic Testing ◽

10.1007/978-1-4757-6527-4_12 ◽

2002 ◽

pp. 175-190 ◽

Cited By ~ 8

Author(s):

Mehrdad Nourani ◽

Amir Attarha ◽

Krishnendu Chakrabarty

Keyword(s):

High Speed ◽

Signal Integrity ◽

Fault Modeling

Download Full-text

Testing for Interconnect Crosstalk Defects Using On-Chip Embedded Processor Cores

SOC (System-on-a-Chip) Testing for Plug and Play Test Automation - Frontiers in Electronic Testing ◽

10.1007/978-1-4757-6527-4_11 ◽

2002 ◽

pp. 165-174

Author(s):

Chen Li ◽

Xiaoliang Bai ◽

Sujit Dey ◽

Krishnendu Chakrabarty

Keyword(s):

Embedded Processor ◽

On Chip ◽

Processor Cores

Download Full-text

Diagnostic Data Compression Techniques for Embedded Memories with Built-In Self-Test

SOC (System-on-a-Chip) Testing for Plug and Play Test Automation - Frontiers in Electronic Testing ◽

10.1007/978-1-4757-6527-4_10 ◽

2002 ◽

pp. 151-163

Author(s):

Jin-Fu Li ◽

Ruey-Shing Tzeng ◽

Cheng-Wen Wu ◽

Krishnendu Chakrabarty

Keyword(s):

Data Compression ◽

Diagnostic Data ◽

Self Test ◽

Built In Self Test ◽

Embedded Memories

Download Full-text

An Integrated Approach to Testing Embedded Cores and Interconnects Using Test Access Mechanism (TAM) Switch

SOC (System-on-a-Chip) Testing for Plug and Play Test Automation - Frontiers in Electronic Testing ◽

10.1007/978-1-4757-6527-4_7 ◽

2002 ◽

pp. 111-121 ◽

Cited By ~ 1

Author(s):

Subhayu Basu ◽

Indranil Sengupta ◽

Dipanwita Roy Chowdhury ◽

Sudipta Bhawmik ◽

Krishnendu Chakrabarty

Keyword(s):

Integrated Approach ◽

Test Access Mechanism ◽

Embedded Cores

Download Full-text

SOC (System-on-a-Chip) Testing for Plug and Play Test Automation - Frontiers in Electronic TestingLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By Springer US

The Role of Test Protocols in Automated Test Generation for Embedded-Core-Based System ICs

On IEEE P1500’s Standard for Embedded Core Test

An Integrated Framework for the Design and Optimization of SOC Test Solutions

Deterministic Test Vector Compression/Decompression for Systems-on-a-Chip Using an Embedded Processor

CAS-BUS: A Test Access Mechanism and a Toolbox Environment for Core-Based System Chip Testing

A Novel Reconfigurable Wrapper for Testing of Embedded Core-Based SOCs and its Associated Scheduling Algorithm

Signal Integrity: Fault Modeling and Testing in High-Speed SoCs

Testing for Interconnect Crosstalk Defects Using On-Chip Embedded Processor Cores

Diagnostic Data Compression Techniques for Embedded Memories with Built-In Self-Test

An Integrated Approach to Testing Embedded Cores and Interconnects Using Test Access Mechanism (TAM) Switch

SOC (System-on-a-Chip) Testing for Plug and Play Test Automation - Frontiers in Electronic Testing
Latest Publications