International Test Conference, 2003. Proceedings. ITC 2003.
Latest Publications

TOTAL DOCUMENTS

223

(FIVE YEARS 0)

H-INDEX

(FIVE YEARS 0)

Published By IEEE

0780381068

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

IBIST/sup TM/ (interconnect built-in self-test) architecture and methodology for pci express: intel's next-generation test and validation methodology for performance IO

International Test Conference, 2003. Proceedings. ITC 2003. ◽

10.1109/test.2003.1270909 ◽

2004 ◽

Cited By ~ 5

Author(s):

J.J. Nejedlo

Keyword(s):

Next Generation ◽

Pci Express ◽

Self Test ◽

Built In Self Test ◽

Test Architecture ◽

Generation Test

Download Full-text

Structural delay testing of latch-based high-speed pipelines with time borrowing

International Test Conference, 2003. Proceedings. ITC 2003. ◽

10.1109/test.2003.1271097 ◽

2004 ◽

Cited By ~ 7

Author(s):

Kun Young Chung ◽

S.K. Gupta

Keyword(s):

High Speed ◽

Delay Testing ◽

Time Borrowing

Download Full-text

Latch divergency in microprocessor failure analysis

International Test Conference, 2003. Proceedings. ITC 2003. ◽

10.1109/test.2003.1270905 ◽

2004 ◽

Cited By ~ 26

Author(s):

P. Dahlgren ◽

P. Dickinson ◽

I. Parulkar

Keyword(s):

Failure Analysis

Download Full-text

Analog circuit test using transfer function coefficient estimates

International Test Conference, 2003. Proceedings. ITC 2003. ◽

10.1109/test.2003.1271104 ◽

2004 ◽

Author(s):

Zhen Guo ◽

J. Savir

Keyword(s):

Transfer Function ◽

Analog Circuit ◽

Coefficient Estimates ◽

Function Coefficient

Download Full-text

Modeling scan chain modifications for scan-in test power minimization

International Test Conference, 2003. Proceedings. ITC 2003. ◽

10.1109/test.2003.1270887 ◽

2004 ◽

Cited By ~ 24

Author(s):

O. Sinanoglu ◽

A. Orailoglu

Keyword(s):

Power Minimization ◽

Test Power ◽

Scan Chain

Download Full-text

Bist for minx 4000 and spartan series fpgas: a case study

International Test Conference, 2003. Proceedings. ITC 2003. ◽

10.1109/test.2003.1271115 ◽

2004 ◽

Cited By ~ 5

Author(s):

C.E. Stroud ◽

K.N. Leach ◽

T.A. Slaughter

Download Full-text

DFFT design for functional testability

International Test Conference, 2003. Proceedings. ITC 2003. ◽

10.1109/test.2003.1271099 ◽

2004 ◽

Author(s):

H. Konuk ◽

L. Mao

Download Full-text

Adapting jtag for ac interconnect testing

International Test Conference, 2003. Proceedings. ITC 2003. ◽

10.1109/test.2003.1270892 ◽

2004 ◽

Cited By ~ 2

Author(s):

L. Whetsel

Keyword(s):

Interconnect Testing

Download Full-text

On reducing wrapper boundary register cells in modular soc testing

International Test Conference, 2003. Proceedings. ITC 2003. ◽

10.1109/test.2003.1270889 ◽

2004 ◽

Cited By ~ 3

Author(s):

Qiang Xu ◽

N. Nicolici

Keyword(s):

Soc Testing

Download Full-text

Register transfer level approach to hybrid time and hardware redundancy based fault secure datapath synthesis

International Test Conference, 2003. Proceedings. ITC 2003. ◽

10.1109/test.2003.1271076 ◽

2004 ◽

Author(s):

Kaijie Wu ◽

R. Karri

Keyword(s):

Hardware Redundancy ◽

Download Full-text

International Test Conference, 2003. Proceedings. ITC 2003.Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

IBIST/sup TM/ (interconnect built-in self-test) architecture and methodology for pci express: intel's next-generation test and validation methodology for performance IO

Structural delay testing of latch-based high-speed pipelines with time borrowing

Latch divergency in microprocessor failure analysis

Analog circuit test using transfer function coefficient estimates

Modeling scan chain modifications for scan-in test power minimization

Bist for minx 4000 and spartan series fpgas: a case study

DFFT design for functional testability

Adapting jtag for ac interconnect testing

On reducing wrapper boundary register cells in modular soc testing

Register transfer level approach to hybrid time and hardware redundancy based fault secure datapath synthesis

International Test Conference, 2003. Proceedings. ITC 2003.
Latest Publications