Reliability Modeling and Analysis of Hot-Carrier Degradation in Multiple-Fin SOI n-Channel FinFETs With Self-Heating

2019 ◽  
Vol 66 (5) ◽  
pp. 2075-2080 ◽  
Author(s):  
Anshul Gupta ◽  
Charu Gupta ◽  
Reinaldo A. Vega ◽  
Terence B. Hook ◽  
Abhisek Dixit
Keyword(s):  
Reliability Modeling ◽  
Modeling And Analysis ◽  
Hot Carrier ◽  
Self Heating ◽  
Hot Carrier Degradation

Investigation of Self-Heating Effect on Hot Carrier Degradation in Multiple-Fin SOI FinFETs

2015 ◽  
Vol 36 (12) ◽  
pp. 1258-1260 ◽  
Author(s):  
Hai Jiang ◽  
Xiaoyan Liu ◽  
Nuo Xu ◽  
Yandong He ◽  
Gang Du ◽  
...  
Keyword(s):  
Heating Effect ◽  
Hot Carrier ◽  
Self Heating ◽  
Hot Carrier Degradation

Self-Heating Effects on Hot Carrier Degradation and Its Impact on Logic Circuit Reliability

2019 ◽  
Vol 19 (2) ◽  
pp. 249-254 ◽  
Author(s):  
Peter Paliwoda ◽  
Zakariae Chbili ◽  
Andreas Kerber ◽  
Tanya Nigam ◽  
K. Nagahiro ◽  
...  
Keyword(s):  
Logic Circuit ◽  
Circuit Reliability ◽  
Hot Carrier ◽  
Self Heating ◽  
Heating Effects ◽  
Hot Carrier Degradation

Self-heating effects and hot carrier degradation in In0.53Ga0.47As gate-all-around MOSFETs

2020 ◽  
Vol 35 (6) ◽  
pp. 065008 ◽  
Author(s):  
P S T N Srinivas ◽  
Arun Kumar ◽  
Satyabrata Jit ◽  
Pramod Kumar Tiwari
Keyword(s):  
Hot Carrier ◽  
Self Heating ◽  
Heating Effects ◽  
Hot Carrier Degradation
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