Investigation of Self-Heating Effect on Hot Carrier Degradation in Multiple-Fin SOI FinFETs

Hai Jiang; Xiaoyan Liu; Nuo Xu; Yandong He; Gang Du; Xing Zhang

doi:10.1109/led.2015.2487045

Investigation of Self-Heating Effect on Hot Carrier Degradation in Multiple-Fin SOI FinFETs

IEEE Electron Device Letters ◽

10.1109/led.2015.2487045 ◽

2015 ◽

Vol 36 (12) ◽

pp. 1258-1260 ◽

Cited By ~ 16

Author(s):

Hai Jiang ◽

Xiaoyan Liu ◽

Nuo Xu ◽

Yandong He ◽

Gang Du ◽

...

Keyword(s):

Heating Effect ◽

Hot Carrier ◽

Self Heating ◽

Hot Carrier Degradation

Download Full-text

In-Situ Monitoring of Self-Heating Effect in Aggressively Scaled FinFETs and Its Quantitative Impact on Hot Carrier Degradation Under Dynamic Circuit Operation

2020 IEEE International Reliability Physics Symposium (IRPS) ◽

10.1109/irps45951.2020.9129591 ◽

2020 ◽

Author(s):

Yiming Qu ◽

Jiwu Lu ◽

Junkang Li ◽

Zhuo Chen ◽

Jie Zhang ◽

...

Keyword(s):

In Situ Monitoring ◽

Heating Effect ◽

Hot Carrier ◽

Self Heating ◽

Quantitative Impact ◽

Hot Carrier Degradation

Download Full-text

Self heating effect on hot carrier degradation characteristic in high voltage n-channel LDMOS

2014 IEEE International Integrated Reliability Workshop Final Report (IIRW) ◽

10.1109/iirw.2014.7049527 ◽

2014 ◽

Cited By ~ 2

Author(s):

Jifa Hao ◽

Mark Pelletier ◽

Robert Murphy ◽

Thomas E. Kopley

Keyword(s):

High Voltage ◽

Heating Effect ◽

Hot Carrier ◽

Self Heating ◽

Degradation Characteristic ◽

Hot Carrier Degradation

Download Full-text

Impact of Self-Heating Effect on Hot Carrier Degradation in High-Voltage LDMOS

2007 IEEE International Electron Devices Meeting ◽

10.1109/iedm.2007.4419090 ◽

2007 ◽

Cited By ~ 9

Author(s):

Chih-Chang Cheng ◽

J.F. Lin ◽

Tahui Wang ◽

T.H. Hsieh ◽

J.T. Tzeng ◽

...

Keyword(s):

High Voltage ◽

Heating Effect ◽

Hot Carrier ◽

Self Heating ◽

Hot Carrier Degradation

Download Full-text

Physical Modeling the Impact of Self-Heating on Hot-Carrier Degradation in pNWFETs

2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) ◽

10.1109/ipfa49335.2020.9260648 ◽

2020 ◽

Author(s):

S. Tyaginov ◽

A. Makarov ◽

A. Chasin ◽

E. Bury ◽

M. Vandemaele ◽

...

Keyword(s):

Physical Modeling ◽

Hot Carrier ◽

Self Heating ◽

The Impact ◽

Hot Carrier Degradation

Download Full-text

Self-Heating Effects on Hot Carrier Degradation and its Impact on Ring-Oscillator Reliability

2018 International Integrated Reliability Workshop (IIRW) ◽

10.1109/iirw.2018.8727093 ◽

2018 ◽

Cited By ~ 2

Author(s):

P. Paliwoda ◽

Z. Chbili ◽

A. Kerber ◽

T. Nigam ◽

D. Singh ◽

...

Keyword(s):

Ring Oscillator ◽

Hot Carrier ◽

Self Heating ◽

Heating Effects ◽

Hot Carrier Degradation

Download Full-text

Ultra fast (<1 ns) electrical characterization of self-heating effect and its impact on hot carrier injection in 14nm FinFETs

2017 IEEE International Electron Devices Meeting (IEDM) ◽

10.1109/iedm.2017.8268520 ◽

2017 ◽

Cited By ~ 6

Author(s):

Yiming Qu ◽

Xi Lin ◽

Junkang Li ◽

Ran Cheng ◽

Xiao Yu ◽

...

Keyword(s):

Electrical Characterization ◽

Heating Effect ◽

Carrier Injection ◽

Hot Carrier ◽

Self Heating ◽

Hot Carrier Injection

Download Full-text

Observation of combined self-heating and hot-carrier degradation in n-type poly-Si thin-film transistors

2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits ◽

10.1109/ipfa.2009.5232559 ◽

2009 ◽

Author(s):

Meng ◽

Mingxiang ◽

Huaisheng ◽

Dongli ◽

Man

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Hot Carrier ◽

Self Heating ◽

Si Thin Film ◽

Hot Carrier Degradation

Download Full-text

Necessity of pulse hot carrier evaluation in suppressing self-heating effect for SOI smart power

2009 21st International Symposium on Power Semiconductor Devices & IC's ◽

10.1109/ispsd.2009.5158007 ◽

2009 ◽

Cited By ~ 8

Author(s):

T. Nitta ◽

S. Yanagi ◽

T. Igarashi ◽

K. Hatasako ◽

S. Maegawa ◽

...

Keyword(s):

Heating Effect ◽

Smart Power ◽

Hot Carrier ◽

Self Heating

Download Full-text

Reliability Modeling and Analysis of Hot-Carrier Degradation in Multiple-Fin SOI n-Channel FinFETs With Self-Heating

IEEE Transactions on Electron Devices ◽

10.1109/ted.2019.2905053 ◽

2019 ◽

Vol 66 (5) ◽

pp. 2075-2080 ◽

Cited By ~ 8

Author(s):

Anshul Gupta ◽

Charu Gupta ◽

Reinaldo A. Vega ◽

Terence B. Hook ◽

Abhisek Dixit

Keyword(s):

Reliability Modeling ◽

Modeling And Analysis ◽

Hot Carrier ◽

Self Heating ◽

Hot Carrier Degradation

Download Full-text

The influence of self heating on the measurement of hot carrier degradation in high voltage n-channel LDMOS

2017 IEEE International Reliability Physics Symposium (IRPS) ◽

10.1109/irps.2017.7936400 ◽

2017 ◽

Cited By ~ 4

Author(s):

Jifa Hao ◽

Mark Pelletier ◽

Robert Murphy ◽

Brian McGowan ◽

Thomas E. Kopley

Keyword(s):

High Voltage ◽

Hot Carrier ◽

Self Heating ◽

Hot Carrier Degradation

Download Full-text