scholarly journals Physical Modeling the Impact of Self-Heating on Hot-Carrier Degradation in pNWFETs

2020 ◽  
Author(s):  
S. Tyaginov ◽  
A. Makarov ◽  
A. Chasin ◽  
E. Bury ◽  
M. Vandemaele ◽  
...  
Keyword(s):  
Physical Modeling ◽  
Hot Carrier ◽  
Self Heating ◽  
The Impact ◽  
Hot Carrier Degradation

The impact of self-heating and its implications on hot-carrier degradation – A modeling study

2021 ◽  
Vol 122 ◽  
pp. 114156
Author(s):  
S. Tyaginov ◽  
A. Makarov ◽  
A. Chasin ◽  
E. Bury ◽  
M. Vandemaele ◽  
...  
Keyword(s):  
Hot Carrier ◽  
Self Heating ◽  
The Impact ◽  
Modeling Study ◽  
Hot Carrier Degradation

THE IMPACT OF DIFFERENT HOT-CARRIER-DEGRADATION COMPONENTS ON THE OPTIMIZATION OF SUBMICRON n-CHANNEL LDD TRANSISTORS

1988 ◽  
Vol 49 (C4) ◽  
pp. C4-787-C4-790
Author(s):  
P. T.J. BIERMANS ◽  
T. POORTER ◽  
H. J.H. MERKS-EPPINGBROEK
Keyword(s):  
Hot Carrier ◽  
The Impact ◽  
Hot Carrier Degradation

Reliability Modeling and Analysis of Hot-Carrier Degradation in Multiple-Fin SOI n-Channel FinFETs With Self-Heating

2019 ◽  
Vol 66 (5) ◽  
pp. 2075-2080 ◽  
Author(s):  
Anshul Gupta ◽  
Charu Gupta ◽  
Reinaldo A. Vega ◽  
Terence B. Hook ◽  
Abhisek Dixit
Keyword(s):  
Reliability Modeling ◽  
Modeling And Analysis ◽  
Hot Carrier ◽  
Self Heating ◽  
Hot Carrier Degradation
Sign in / Sign up

Export Citation Format

Share Document