Observation of combined self-heating and hot-carrier degradation in n-type poly-Si thin-film transistors

2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits ◽

10.1109/ipfa.2009.5232559 ◽

2009 ◽

Author(s):

Meng ◽

Mingxiang ◽

Huaisheng ◽

Dongli ◽

Man

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Hot Carrier ◽

Self Heating ◽

Si Thin Film ◽

Hot Carrier Degradation

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Evaluation of self-heating and hot carrier degradation of poly-Si thin-film transistors using charge pumping technique

2010 IEEE International Reliability Physics Symposium ◽

10.1109/irps.2010.5488678 ◽

2010 ◽

Cited By ~ 1

Author(s):

Xiaowei Lu ◽

Mingxiang Wang ◽

Kai Sun ◽

Lei Lu

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Charge Pumping ◽

Hot Carrier ◽

Self Heating ◽

Si Thin Film ◽

Hot Carrier Degradation

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Gate Voltage Pulse Rising Edge Dependent Dynamic Hot Carrier Degradation in Poly-Si Thin-Film Transistors

IEEE Electron Device Letters ◽

10.1109/led.2021.3110916 ◽

2021 ◽

pp. 1-1

Author(s):

Lekai Chen ◽

Mingxiang Wang ◽

Dongli Zhang ◽

Huaisheng Wang

Keyword(s):

Thin Film ◽

Gate Voltage ◽

Voltage Pulse ◽

Thin Film Transistors ◽

Hot Carrier ◽

Si Thin Film ◽

Hot Carrier Degradation

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Experimental evidence of grain-boundary related hot-carrier degradation mechanism in low-temperature poly-Si thin-film-transistors

IEEE International Electron Devices Meeting 2003 ◽

10.1109/iedm.2003.1269250 ◽

2004 ◽

Cited By ~ 6

Author(s):

T. Yoshida ◽

K. Yoshino ◽

M. Takei ◽

A. Hara ◽

N. Sasaki ◽

...

Keyword(s):

Thin Film ◽

Low Temperature ◽

Grain Boundary ◽

Experimental Evidence ◽

Thin Film Transistors ◽

Degradation Mechanism ◽

Hot Carrier ◽

Si Thin Film ◽

Hot Carrier Degradation

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Grain-Boundary Related Hot Carrier Degradation Mechanism in Low-Temperature Poly-Si Thin-Film-Transistors

10.7567/ssdm.2002.d-9-5 ◽

2002 ◽

Cited By ~ 2

Author(s):

T. Yoshida ◽

Y. Ebiko ◽

M. Takei ◽

N. Sasaki ◽

T. Tsuchiya

Keyword(s):

Thin Film ◽

Low Temperature ◽

Grain Boundary ◽

Thin Film Transistors ◽

Degradation Mechanism ◽

Hot Carrier ◽

Si Thin Film ◽

Hot Carrier Degradation

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Positive Bias Temperature Instability and Hot Carrier Degradation of Back-End-of-Line, nm-Thick, In2O3 Thin-Film Transistors

IEEE Electron Device Letters ◽

10.1109/led.2021.3134902 ◽

2021 ◽

pp. 1-1

Author(s):

Yen-Pu Chen ◽

Mengwei Si ◽

Bikram Kishore Mahajan ◽

Zehao Lin ◽

Peide D. Ye ◽

...

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Positive Bias ◽

Temperature Instability ◽

Hot Carrier ◽

Bias Temperature Instability ◽

Hot Carrier Degradation

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Study of Degradation Phenomenon Due to a Combination of Contamination and Self-Heating in Poly-Si Thin Film Transistors Fabricated by a Low-Temperature Process

Japanese Journal of Applied Physics ◽

10.1143/jjap.42.4213 ◽

2003 ◽

Vol 42 (Part 1, No. 7A) ◽

pp. 4213-4217 ◽

Cited By ~ 20

Author(s):

Satoshi Inoue ◽

Satoshi Takenaka ◽

Tatsuya Shimoda

Keyword(s):

Thin Film ◽

Low Temperature ◽

Thin Film Transistors ◽

Self Heating ◽

Si Thin Film ◽

Low Temperature Process

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Hot-Carrier Degradation and Electric Field and Electron Concentration near Drain Junction in Low-Temperature N-Channel Single Drain and Lightly Doped Drain Polycrystalline Silicon Thin Film Transistors

Japanese Journal of Applied Physics ◽

10.1143/jjap.46.1322 ◽

2007 ◽

Vol 46 (3B) ◽

pp. 1322-1327 ◽

Cited By ~ 5

Author(s):

Gen Usami ◽

Yukisato Nogami ◽

Toshihisa Yajima ◽

Masahiro Yamagata ◽

Toshifumi Satoh ◽

...

Keyword(s):

Thin Film ◽

Low Temperature ◽

Electric Field ◽

Electron Concentration ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Silicon Thin Film ◽

Hot Carrier ◽

Lightly Doped Drain ◽

Hot Carrier Degradation

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Analysis of Self-Heating in Poly-Si Thin-Film Transistors and Circuits by a Self-Consistent Electro-Thermal Simulation Approach

2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings ◽

10.1109/icsict.2006.306195 ◽

2006 ◽

Author(s):

Xiaojun Guo ◽

S.R.P. Silva

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Thermal Simulation ◽

Simulation Approach ◽

Self Heating ◽

Self Consistent ◽

Si Thin Film

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Suppress Dynamic Hot-Carrier Induced Degradation in Polycrystalline Si Thin-Film Transistors by Using a Substrate Terminal

IEEE Electron Device Letters ◽

10.1109/led.2014.2308987 ◽

2014 ◽

Vol 35 (5) ◽

pp. 551-553 ◽

Cited By ~ 7

Author(s):

Huaisheng Wang ◽

Mingxiang Wang ◽

Dongli Zhang

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Hot Carrier ◽

Si Thin Film

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Effective density-of-states distribution of polycrystalline silicon thin-film transistors under hot-carrier degradation

Journal of Applied Physics ◽

10.1063/1.2777804 ◽

2007 ◽

Vol 102 (5) ◽

pp. 054508 ◽

Cited By ~ 15

Author(s):

Ming-Hsien Lee ◽

Kai-Hsiang Chang ◽

Horng-Chih Lin

Keyword(s):

Thin Film ◽

Density Of States ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Effective Density ◽

Silicon Thin Film ◽

Hot Carrier ◽

Hot Carrier Degradation

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