2017 IEEE International Reliability Physics Symposium (IRPS)
Latest Publications

TOTAL DOCUMENTS

183
(FIVE YEARS 0)

H-INDEX

11
(FIVE YEARS 0)

Published By IEEE

9781509066414
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Impact of TSV process on 14nm FEOL and BEOL reliability

2017 ◽  
Author(s):  
Sukeshwar Kannan ◽  
C. S. Premachandran ◽  
Daniel Smith ◽  
Rakesh Ranjan ◽  
Salvatore Cimino ◽  
...  

Reliability of hybrid-drain-embedded gate injection transistor

2017 ◽  
Author(s):  
Kenichiro Tanaka ◽  
Tatsuo Morita ◽  
Masahiro Ishida ◽  
Tsuguyasu Hatsuda ◽  
Tetsuzo Ueda ◽  
...  

New insights on strained SiGe channels pFET NBTI reliability

2017 ◽  
Author(s):  
C. Ndiaye ◽  
A. Biavaix ◽  
M. Aiabi ◽  
R. Berthelon ◽  
V. Huard ◽  
...  
Keyword(s):  
Strained Sige

Failure mode for p-GaN gates under forward gate stress with varying Mg concentration

2017 ◽  
Author(s):  
S. Stoffels ◽  
B. Bakeroot ◽  
T. L. Wu ◽  
D. Marcon ◽  
N. E. Posthuma ◽  
...  
Keyword(s):  
Failure Mode

Reliability of 2T-core CMOS OTP non-volatile memory bitcells

2017 ◽  
Author(s):  
R. Ranjan ◽  
T. Nigam ◽  
Y. Liu ◽  
A. Gondal ◽  
A. Kerber ◽  
...  
Keyword(s):  
Non Volatile Memory ◽  
Volatile Memory
Load More ...
Sign in / Sign up

Export Citation Format

Share Document