Full-Band 3-D Monte Carlo Simulation of InAs Nanowires and High Frequency Analysis

2015 ◽  
Vol 62 (6) ◽  
pp. 1848-1854
Author(s):  
Bogdan Popescu ◽  
Dan Popescu ◽  
Marco Saraniti ◽  
Paolo Lugli
2011 ◽  
Vol 20 (03) ◽  
pp. 423-430
Author(s):  
DIEGO GUERRA ◽  
FABIO ALESSIO MARINO ◽  
STEPHEN GOODNICK ◽  
DAVID FERRY ◽  
MARCO SARANITI

A high-frequency a high-power GaN HEMT was analyzed using our full band Cellular Monte Carlo (CMC) simulator, in order to extract small signal parameters and figures of merit, and to correlate them to carrier dynamics and distribution inside the device. A complete RF and DC characterization of the device was performed using experimental data to calibrate the few adjustable parameters of the simulator. Then, gate-related capacitances, such as Cg, Cgd, and Cgs, were directly and indirectly extracted combining small-signal analysis and DC characterization.


2010 ◽  
Vol 10 (11) ◽  
pp. 7015-7019 ◽  
Author(s):  
Ming Shi ◽  
Jérôme Saint-Martin ◽  
Arnaud Bournel ◽  
Hassan Maher ◽  
Michel Renvoise ◽  
...  

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