Competing hot carrier degradation mechanisms in lateral n-type DMOS transistors

Author(s):  
P. Moens ◽  
G. Van den Bosch ◽  
G. Groeseneken
Author(s):  
R. Woltjer ◽  
G.M. Paulzen ◽  
H.G. Pomp ◽  
H. Lifka ◽  
P.H. Woerlee

1996 ◽  
Vol 36 (7-8) ◽  
pp. 845-869 ◽  
Author(s):  
Alexander Acovic ◽  
Giuseppe La Rosa ◽  
Yuan-Chen Sun

Author(s):  
T. A. Karatsori ◽  
C. G. Theodorou ◽  
S. Haendler ◽  
N. Planes ◽  
G. Ghibaudo ◽  
...  

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