Unified model for n-channel hot-carrier degradation under different degradation mechanisms

1996 ◽  
Author(s):  
M. Pagey ◽  
R. Milanowski ◽  
E. Snyder ◽  
N. Bui ◽  
B. Deem ◽  
...  
Keyword(s):  
Unified Model ◽  
Degradation Mechanisms ◽  
Hot Carrier ◽  
Hot Carrier Degradation

New hot-carrier degradation mechanisms in 0.25 μm PMOSFETs

2002 ◽  
Author(s):  
R. Woltjer ◽  
G.M. Paulzen ◽  
H.G. Pomp ◽  
H. Lifka ◽  
P.H. Woerlee
Keyword(s):  
Degradation Mechanisms ◽  
Hot Carrier ◽  
Hot Carrier Degradation

A review of hot-carrier degradation mechanisms in MOSFETs

1996 ◽  
Vol 36 (7-8) ◽  
pp. 845-869 ◽  
Author(s):  
Alexander Acovic ◽  
Giuseppe La Rosa ◽  
Yuan-Chen Sun
Keyword(s):  
Degradation Mechanisms ◽  
Hot Carrier ◽  
Hot Carrier Degradation
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