Hot carrier degradation mechanisms of short-channel FDSOI n-MOSFETs
1997 ◽
Vol 37
(7)
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pp. 1003-1013
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2010 ◽
Vol 87
(1)
◽
pp. 47-50
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2010 ◽
Vol 23
(4-5)
◽
pp. 315-323
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2009 ◽
Vol 86
(7-9)
◽
pp. 1908-1910
◽
2009 ◽
Vol 9
(3)
◽
pp. 454-458
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