Novel Hot-Carrier Degradation Mechanisms in the Lateral Insulated-Gate Bipolar Transistor on SOI Substrate

2011 ◽  
Vol 58 (4) ◽  
pp. 1158-1163 ◽  
Author(s):  
Qinsong Qian ◽  
Weifeng Sun ◽  
Siyang Liu ◽  
Jing Zhu
Keyword(s):  
Bipolar Transistor ◽  
Degradation Mechanisms ◽  
Hot Carrier ◽  
Insulated Gate Bipolar Transistor ◽  
Hot Carrier Degradation

Role of the bipolar transistor on the hot-carrier-degradation of SOI MOSFETs

2002 ◽  
Author(s):  
Y.S. Chang ◽  
S. Cristoloveanu ◽  
G. Reichert ◽  
P. Gentil ◽  
S.S. Li ◽  
...  
Keyword(s):  
Bipolar Transistor ◽  
Hot Carrier ◽  
Hot Carrier Degradation

New hot-carrier degradation mechanisms in 0.25 μm PMOSFETs

2002 ◽  
Author(s):  
R. Woltjer ◽  
G.M. Paulzen ◽  
H.G. Pomp ◽  
H. Lifka ◽  
P.H. Woerlee
Keyword(s):  
Degradation Mechanisms ◽  
Hot Carrier ◽  
Hot Carrier Degradation

A review of hot-carrier degradation mechanisms in MOSFETs

1996 ◽  
Vol 36 (7-8) ◽  
pp. 845-869 ◽  
Author(s):  
Alexander Acovic ◽  
Giuseppe La Rosa ◽  
Yuan-Chen Sun
Keyword(s):  
Degradation Mechanisms ◽  
Hot Carrier ◽  
Hot Carrier Degradation
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