Charge trapping and degradation of HfO/sub 2//SiO/sub 2/ MOS gate stacks observed with enhanced CAFM
2006 ◽
Vol 27
(3)
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pp. 157-159
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Keyword(s):
2006 ◽
Vol 50
(9-10)
◽
pp. 1670-1672
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Keyword(s):
2017 ◽
Vol 38
(3)
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pp. 318-321
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2005 ◽
Vol 26
(12)
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pp. 913-915
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Keyword(s):