Impact of hot-carrier degradation on the low-frequency noise in MOSFETs under steady-state and periodic large-signal excitation

2005 ◽  
Vol 26 (10) ◽  
pp. 764-766 ◽  
Author(s):  
J. Kolhatkar ◽  
E. Hoekstra ◽  
A. Hof ◽  
C. Salm ◽  
J. Schmitz ◽  
...  
Keyword(s):  
Steady State ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Large Signal ◽  
Hot Carrier ◽  
Hot Carrier Degradation

Change in Transfer and Low-Frequency Noise Characteristics of n-Channel Polysilicon TFTs Due to Hot-Carrier Degradation

2004 ◽  
Vol 25 (6) ◽  
pp. 390-392 ◽  
Author(s):  
A. Hatzopoulos ◽  
N. Archontas ◽  
N.A. Hastas ◽  
C.A. Dimitriadis ◽  
G. Kamarinos ◽  
...  
Keyword(s):  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Hot Carrier ◽  
Noise Characteristics ◽  
Hot Carrier Degradation

Effect of $\hbox{NH}_{3}$ Plasma Nitridation on Hot-Carrier Instability and Low-Frequency Noise in Gd-Doped High-$ \kappa$ Dielectric nMOSFETs

2011 ◽  
Vol 58 (3) ◽  
pp. 812-818 ◽  
Author(s):  
Yu-Ting Chen ◽  
Kun-Ming Chen ◽  
Cheng-Li Lin ◽  
Wen-Kuan Yeh ◽  
Guo-Wei Huang ◽  
...  
Keyword(s):  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Hot Carrier ◽  
Plasma Nitridation

Investigation of Low-Frequency Noise Behavior After Hot-Carrier Stress in an n-Channel Junctionless Nanowire MOSFET

2012 ◽  
Vol 33 (11) ◽  
pp. 1538-1540 ◽  
Author(s):  
Chan-Hoon Park ◽  
Myung-Dong Ko ◽  
Ki-Hyun Kim ◽  
Sang-Hyun Lee ◽  
Jun-Sik Yoon ◽  
...  
Keyword(s):  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Hot Carrier ◽  
Hot Carrier Stress ◽  
Nanowire Mosfet
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