Investigation of Low-Frequency Noise Behavior After Hot-Carrier Stress in an n-Channel Junctionless Nanowire MOSFET

2012 ◽  
Vol 33 (11) ◽  
pp. 1538-1540 ◽  
Author(s):  
Chan-Hoon Park ◽  
Myung-Dong Ko ◽  
Ki-Hyun Kim ◽  
Sang-Hyun Lee ◽  
Jun-Sik Yoon ◽  
...  
2004 ◽  
Author(s):  
Kun-Ming Chen ◽  
Hsin-Hui Hu ◽  
Guo-Wei Huang ◽  
Chun-Yen Chang

2011 ◽  
Vol 58 (3) ◽  
pp. 812-818 ◽  
Author(s):  
Yu-Ting Chen ◽  
Kun-Ming Chen ◽  
Cheng-Li Lin ◽  
Wen-Kuan Yeh ◽  
Guo-Wei Huang ◽  
...  

2004 ◽  
Vol 48 (6) ◽  
pp. 985-997 ◽  
Author(s):  
François Dieudonné ◽  
Sébastien Haendler ◽  
Jalal Jomaah ◽  
Francis Balestra

1997 ◽  
Vol 18 (10) ◽  
pp. 480-482 ◽  
Author(s):  
E. Simoen ◽  
P. Vasina ◽  
J. Sikula ◽  
C. Claeys

2007 ◽  
Vol 47 (4-5) ◽  
pp. 577-580 ◽  
Author(s):  
Cora Salm ◽  
Eric Hoekstra ◽  
Jay S. Kolhatkar ◽  
André J. Hof ◽  
Hans Wallinga ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document