Investigation of Low-Frequency Noise Behavior After Hot-Carrier Stress in an n-Channel Junctionless Nanowire MOSFET
2012 ◽
Vol 33
(11)
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pp. 1538-1540
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Keyword(s):
Keyword(s):
2011 ◽
Vol 58
(3)
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pp. 812-818
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Keyword(s):
Keyword(s):
2004 ◽
Vol 48
(6)
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pp. 985-997
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1996 ◽
Vol 51-52
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pp. 585-596
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2007 ◽
Vol 47
(4-5)
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pp. 577-580
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