Change in Transfer and Low-Frequency Noise Characteristics of n-Channel Polysilicon TFTs Due to Hot-Carrier Degradation

A. Hatzopoulos; N. Archontas; N.A. Hastas; C.A. Dimitriadis; G. Kamarinos; N. Georgoulas; A. Thanailakis

doi:10.1109/led.2004.828555

Change in Transfer and Low-Frequency Noise Characteristics of n-Channel Polysilicon TFTs Due to Hot-Carrier Degradation

IEEE Electron Device Letters ◽

10.1109/led.2004.828555 ◽

2004 ◽

Vol 25 (6) ◽

pp. 390-392 ◽

Cited By ~ 7

Author(s):

A. Hatzopoulos ◽

N. Archontas ◽

N.A. Hastas ◽

C.A. Dimitriadis ◽

G. Kamarinos ◽

...

Keyword(s):

Low Frequency ◽

Frequency Noise ◽

Low Frequency Noise ◽

Hot Carrier ◽

Noise Characteristics ◽

Hot Carrier Degradation

Download Full-text

Low-frequency noise of 90nm nFETs: hot-carrier degradation and deuterium effect

Digest of Papers. 2004 Topical Meeting onSilicon Monolithic Integrated Circuits in RF Systems, 2004. ◽

10.1109/smic.2004.1398184 ◽

2005 ◽

Author(s):

M. Erturk ◽

R. Anna ◽

T. Xia ◽

W.F. Clark ◽

K.M. Newton ◽

...

Keyword(s):

Low Frequency ◽

Frequency Noise ◽

Low Frequency Noise ◽

Hot Carrier ◽

Hot Carrier Degradation

Download Full-text

Impact of hot-carrier degradation on the low-frequency noise in MOSFETs under steady-state and periodic large-signal excitation

IEEE Electron Device Letters ◽

10.1109/led.2005.856009 ◽

2005 ◽

Vol 26 (10) ◽

pp. 764-766 ◽

Cited By ~ 5

Author(s):

J. Kolhatkar ◽

E. Hoekstra ◽

A. Hof ◽

C. Salm ◽

J. Schmitz ◽

...

Keyword(s):

Steady State ◽

Low Frequency ◽

Frequency Noise ◽

Low Frequency Noise ◽

Large Signal ◽

Hot Carrier ◽

Hot Carrier Degradation

Download Full-text

Correction to "Hot-carrier degradation of the low-frequency noise in MOS transistors under analog and RF operating conditions"

IEEE Transactions on Electron Devices ◽

10.1109/ted.2003.808739 ◽

2002 ◽

Vol 49 (12) ◽

pp. 2373-2373

Author(s):

R. Brederlow ◽

W. Weber ◽

D. Schmitt-Landsiedel ◽

R. Thewes

Keyword(s):

Low Frequency ◽

Operating Conditions ◽

Frequency Noise ◽

Low Frequency Noise ◽

Mos Transistors ◽

Hot Carrier ◽

Hot Carrier Degradation

Download Full-text

Impact of Hot Carrier Stress on Low-Frequency Noise Characteristics in Floating-Body SOI MOSFETs

10.7567/ssdm.2001.c-6-4 ◽

2001 ◽

Author(s):

Toshiaki Tsuchiya ◽

Toshiyuki Yoshida ◽

Yasuhiro Sato

Keyword(s):

Low Frequency ◽

Floating Body ◽

Frequency Noise ◽

Low Frequency Noise ◽

Hot Carrier ◽

Noise Characteristics ◽

Hot Carrier Stress

Download Full-text

Investigation of the hot-carrier degradation in Si/SiGe HBT's by intrinsic low frequency noise source modeling

2001 GaAs Reliability Workshop. Proceedings (IEEE Cat. No.01TH8602) ◽

10.1109/gaasrw.2001.995726 ◽

2002 ◽

Author(s):

M. Borgarino ◽

J. Kuchenbecker ◽

J.G. Tartarin ◽

L. Bary ◽

T. Kovacic ◽

...

Keyword(s):

Noise Source ◽

Low Frequency ◽

Frequency Noise ◽

Low Frequency Noise ◽

Source Modeling ◽

Hot Carrier ◽

Hot Carrier Degradation

Download Full-text

Effects of hot-carrier degradation on the low frequency noise in strained-Si p-MOSFETs

International Journal of Nanoparticles ◽

10.1504/ijnp.2018.092677 ◽

2018 ◽

Vol 10 (1/2) ◽

pp. 58 ◽

Cited By ~ 1

Author(s):

Sanghamitra Das ◽

T.P. Dash ◽

Chinmay K. Maiti

Keyword(s):

Low Frequency ◽

Frequency Noise ◽

Low Frequency Noise ◽

Strained Si ◽

Hot Carrier ◽

Hot Carrier Degradation

Download Full-text

Low-frequency noise characteristics of hot carrier-stressed buried-channel pMOSFETs

Solid-State Electronics ◽

10.1016/s0038-1101(97)00209-8 ◽

1998 ◽

Vol 42 (3) ◽

pp. 411-418 ◽

Cited By ~ 2

Author(s):

Sheng-Lyang Jang ◽

Heng-Kuen Chen ◽

Kow-Ming Chang

Keyword(s):

Low Frequency ◽

Frequency Noise ◽

Low Frequency Noise ◽

Hot Carrier ◽

Buried Channel ◽

Noise Characteristics

Download Full-text

Hot carrier degradation of the low frequency noise of MOS transistors under analog operating conditions

1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual (Cat. No.99CH36296) ◽

10.1109/relphy.1999.761619 ◽

2003 ◽

Cited By ~ 2

Author(s):

R. Brederlow ◽

W. Weber ◽

D. Schmitt-Landsiedel ◽

R. Thewes

Keyword(s):

Low Frequency ◽

Operating Conditions ◽

Frequency Noise ◽

Low Frequency Noise ◽

Mos Transistors ◽

Hot Carrier ◽

Hot Carrier Degradation

Download Full-text

Effects of hot-carrier degradation on the low frequency noise in strained-Si p-MOSFETs

International Journal of Nanoparticles ◽

10.1504/ijnp.2018.10013921 ◽

2018 ◽

Vol 10 (1/2) ◽

pp. 58

Author(s):

Sanghamitra Das ◽

Chinmay K. Maiti ◽

T.P. Dash

Keyword(s):

Low Frequency ◽

Frequency Noise ◽

Low Frequency Noise ◽

Strained Si ◽

Hot Carrier ◽

Hot Carrier Degradation

Download Full-text

Hot-carrier degradation of the low-frequency noise in MOS transistors under analog and RF operating conditions

IEEE Transactions on Electron Devices ◽

10.1109/ted.2002.802640 ◽

2002 ◽

Vol 49 (9) ◽

pp. 1588-1596 ◽

Cited By ~ 21

Author(s):

R. Brederlow ◽

W. Weber ◽

D. Schmitt-Landsiedel ◽

R. Thewes

Keyword(s):

Low Frequency ◽

Operating Conditions ◽

Frequency Noise ◽

Low Frequency Noise ◽

Mos Transistors ◽

Hot Carrier ◽

Hot Carrier Degradation

Download Full-text