The recovery effect of hot-carrier degradation under dynamic stress condition for SOI-nLDMOS device

2013 ◽  
Author(s):  
Chunwei Zhang ◽  
Siyang Liu ◽  
Weifeng Sun ◽  
Wei Su ◽  
Yuwei Liu ◽  
...  
Keyword(s):  
Dynamic Stress ◽  
Stress Condition ◽  
Recovery Effect ◽  
Hot Carrier ◽  
Hot Carrier Degradation

Two-stage hot-carrier degradation behavior of 0.18μm 18V n-type DEMOS and its recovery effect

2009 ◽  
Vol 49 (1) ◽  
pp. 8-12 ◽  
Author(s):  
Chao Gao ◽  
Jun Wang ◽  
Lei Wang ◽  
Andrew Yap ◽  
Hong Li
Keyword(s):  
Degradation Behavior ◽  
Recovery Effect ◽  
Two Stage ◽  
Hot Carrier ◽  
Hot Carrier Degradation

Hot-Carrier Degradation During Dynamic Stress

1992 ◽  
pp. 250-310 ◽  
Author(s):  
W. Weber ◽  
M. Brox ◽  
R. Bellens ◽  
P. Heremans ◽  
G. Groeseneken ◽  
...  
Keyword(s):  
Dynamic Stress ◽  
Hot Carrier ◽  
Hot Carrier Degradation

ANALYSIS OF HOT CARRIER DEGRADATION IN AC STRESSED N-CHANNEL MOS TRANSISTORS USING THE CHARGE PUMPING TECHNIQUE

1988 ◽  
Vol 49 (C4) ◽  
pp. C4-651-C4-655 ◽  
Author(s):  
R. BELLENS ◽  
P. HEREMANS ◽  
G. GROESENEKEN ◽  
H. E. MAES
Keyword(s):  
Mos Transistors ◽  
Charge Pumping ◽  
Hot Carrier ◽  
Hot Carrier Degradation

THE IMPACT OF DIFFERENT HOT-CARRIER-DEGRADATION COMPONENTS ON THE OPTIMIZATION OF SUBMICRON n-CHANNEL LDD TRANSISTORS

1988 ◽  
Vol 49 (C4) ◽  
pp. C4-787-C4-790
Author(s):  
P. T.J. BIERMANS ◽  
T. POORTER ◽  
H. J.H. MERKS-EPPINGBROEK
Keyword(s):  
Hot Carrier ◽  
The Impact ◽  
Hot Carrier Degradation

Localizing Hot-Carrier Degradation in Silicon Trench MOSFETs

2021 ◽  
Vol 68 (4) ◽  
pp. 1804-1809
Author(s):  
Bernhard Ruch ◽  
Gregor Pobegen ◽  
Tibor Grasser
Keyword(s):  
Hot Carrier ◽  
Hot Carrier Degradation
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