The worst stress condition of hot carrier degradation on high voltage LDMOSFET

Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) ◽

10.1109/ipfa.2013.6599255 ◽

2013 ◽

Author(s):

Sarah Zhou Huayang ◽

Yongliang Song ◽

Zhuo Song ◽

Lisa Yu Yanju ◽

Atman Zhao Yong ◽

...

Keyword(s):

High Voltage ◽

Stress Condition ◽

Hot Carrier ◽

Hot Carrier Degradation

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Analysis of worst-case hot-carrier degradation conditions in the case of n- and p-channel high-voltage MOSFETs

2011 International Conference on Simulation of Semiconductor Processes and Devices ◽

10.1109/sispad.2011.6035066 ◽

2011 ◽

Cited By ~ 4

Author(s):

Ivan Starkov ◽

Hajdin Ceric ◽

Stanislav Tyaginov ◽

Tibor Grasser ◽

Hubert Enichlmair ◽

...

Keyword(s):

High Voltage ◽

Worst Case ◽

Hot Carrier ◽

Hot Carrier Degradation

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The influence of self heating on the measurement of hot carrier degradation in high voltage n-channel LDMOS

2017 IEEE International Reliability Physics Symposium (IRPS) ◽

10.1109/irps.2017.7936400 ◽

2017 ◽

Cited By ~ 4

Author(s):

Jifa Hao ◽

Mark Pelletier ◽

Robert Murphy ◽

Brian McGowan ◽

Thomas E. Kopley

Keyword(s):

High Voltage ◽

Hot Carrier ◽

Self Heating ◽

Hot Carrier Degradation

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A new hot-carrier degradation mechanism in high voltage nLEDMOS transistors

2008 26th International Conference on Microelectronics ◽

10.1109/icmel.2008.4559356 ◽

2008 ◽

Author(s):

Hong Wu ◽

Weifeng Sun ◽

Yangbo Yi ◽

Haisong Li ◽

Longxing Shi

Keyword(s):

High Voltage ◽

Degradation Mechanism ◽

Hot Carrier ◽

Hot Carrier Degradation

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Study and optimization of hot-carrier degradation in high voltage pledmos transistor with thick gate oxide

2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits ◽

10.1109/ipfa.2009.5232694 ◽

2009 ◽

Cited By ~ 2

Author(s):

Hong Wu ◽

Qinsong Qian ◽

Siyang Liu ◽

Weifeng Sun ◽

Longxing Shi

Keyword(s):

High Voltage ◽

Gate Oxide ◽

Hot Carrier ◽

Hot Carrier Degradation

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The recovery effect of hot-carrier degradation under dynamic stress condition for SOI-nLDMOS device

2013 IEEE International Conference of Electron Devices and Solid-state Circuits ◽

10.1109/edssc.2013.6628131 ◽

2013 ◽

Author(s):

Chunwei Zhang ◽

Siyang Liu ◽

Weifeng Sun ◽

Wei Su ◽

Yuwei Liu ◽

...

Keyword(s):

Dynamic Stress ◽

Stress Condition ◽

Recovery Effect ◽

Hot Carrier ◽

Hot Carrier Degradation

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Investigation of Hot Carrier Degradation in STI-based High-Voltage LDMOSFETs by a Novel DCIV technique

10.7567/ssdm.2011.p-14-17 ◽

2011 ◽

Author(s):

Y. He ◽

G. Zhang

Keyword(s):

High Voltage ◽

Hot Carrier ◽

Hot Carrier Degradation

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Self heating effect on hot carrier degradation characteristic in high voltage n-channel LDMOS

2014 IEEE International Integrated Reliability Workshop Final Report (IIRW) ◽

10.1109/iirw.2014.7049527 ◽

2014 ◽

Cited By ~ 2

Author(s):

Jifa Hao ◽

Mark Pelletier ◽

Robert Murphy ◽

Thomas E. Kopley

Keyword(s):

High Voltage ◽

Heating Effect ◽

Hot Carrier ◽

Self Heating ◽

Degradation Characteristic ◽

Hot Carrier Degradation

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Impact of lateral non-uniform doping and hot carrier degradation on capacitance behavior of high voltage MOSFETs

ESSDERC 2007 - 37th European Solid State Device Research Conference ◽

10.1109/essderc.2007.4430969 ◽

2007 ◽

Cited By ~ 6

Author(s):

Yogesh Singh Chauhan ◽

Renaud Gillon ◽

Michel Declercq ◽

Adrian Mihai Ionescu

Keyword(s):

High Voltage ◽

Hot Carrier ◽

Uniform Doping ◽

Hot Carrier Degradation

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Impact of Self-Heating Effect on Hot Carrier Degradation in High-Voltage LDMOS

2007 IEEE International Electron Devices Meeting ◽

10.1109/iedm.2007.4419090 ◽

2007 ◽

Cited By ~ 9

Author(s):

Chih-Chang Cheng ◽

J.F. Lin ◽

Tahui Wang ◽

T.H. Hsieh ◽

J.T. Tzeng ◽

...

Keyword(s):

High Voltage ◽

Heating Effect ◽

Hot Carrier ◽

Self Heating ◽

Hot Carrier Degradation

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Reduction of hot carrier degradation in high voltage n-channel LDMOS BCD (Bipolar-CMOS-DMOS) technology

2016 IEEE International Integrated Reliability Workshop (IIRW) ◽

10.1109/iirw.2016.7904897 ◽

2016 ◽

Cited By ~ 1

Author(s):

Jifa Hao ◽

Daniel Hahn

Keyword(s):

High Voltage ◽

Hot Carrier ◽

Hot Carrier Degradation

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