Early stage hot carrier degradation of state-of-the-art LDD N-MOSFETs
2001 ◽
Vol 41
(2)
◽
pp. 169-177
◽
1993 ◽
Vol 140
(6)
◽
pp. 431
◽
Keyword(s):
1988 ◽
Vol 49
(C4)
◽
pp. C4-651-C4-655
◽
1988 ◽
Vol 49
(C4)
◽
pp. C4-787-C4-790
2021 ◽
Vol 68
(4)
◽
pp. 1804-1809
Keyword(s):
2018 ◽
pp. 319-323
◽
Keyword(s):
2008 ◽
Vol 48
(4)
◽
pp. 508-513
◽