Hot Carrier Design Considerations for MOS Devices and Circuits
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Published By Springer US

9781468485493, 9781468485479
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The Mechanisms of Hot-Carrier Degradation

1992 ◽  
pp. 1-119 ◽  
Author(s):  
P. Heremans ◽  
R. Bellens ◽  
G. Groeseneken ◽  
A. v. Schwerin ◽  
H. E. Maes ◽  
...  
Keyword(s):  
Hot Carrier ◽  
Hot Carrier Degradation

Hot-Carrier Degradation During Dynamic Stress

1992 ◽  
pp. 250-310 ◽  
Author(s):  
W. Weber ◽  
M. Brox ◽  
R. Bellens ◽  
P. Heremans ◽  
G. Groeseneken ◽  
...  
Keyword(s):  
Dynamic Stress ◽  
Hot Carrier ◽  
Hot Carrier Degradation
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