International Technical Digest on Electron Devices Meeting
Latest Publications

TOTAL DOCUMENTS

247

(FIVE YEARS 0)

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Published By IEEE

0780308174

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Field emission imaging study of silicon field emitters

International Technical Digest on Electron Devices Meeting ◽

10.1109/iedm.1992.307380 ◽

1992 ◽

Author(s):

Jiang Liu ◽

Hren ◽

Sune ◽

Jones ◽

Gray

Keyword(s):

Field Emission ◽

Imaging Study ◽

Field Emitters

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Quasi-SOI MOSFETs using selective epitaxy and polishing

International Technical Digest on Electron Devices Meeting ◽

10.1109/iedm.1992.307374 ◽

1992 ◽

Cited By ~ 18

Author(s):

Nguyen ◽

Kuehne ◽

Renteln ◽

Wong

Keyword(s):

Selective Epitaxy

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Hot-carrier degradation of p-MOSFET's in analog operation: the relevance of the channel-length-independent drain conductance degradation

International Technical Digest on Electron Devices Meeting ◽

10.1109/iedm.1992.307417 ◽

1992 ◽

Cited By ~ 2

Author(s):

Thewes ◽

Brox ◽

Tempel ◽

Weber ◽

Goser

Keyword(s):

Channel Length ◽

Hot Carrier ◽

Drain Conductance ◽

Hot Carrier Degradation

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New CMOS shallow junction well FET structure (CMOS-SJET) for low power-supply voltage

International Technical Digest on Electron Devices Meeting ◽

10.1109/iedm.1992.307504 ◽

1992 ◽

Cited By ~ 11

Author(s):

Yoshimura ◽

Matsuoka ◽

Kakumu

Keyword(s):

Low Power ◽

Power Supply ◽

Supply Voltage ◽

Power Supply Voltage ◽

Shallow Junction

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The double-cusp gyro-gun

International Technical Digest on Electron Devices Meeting ◽

10.1109/iedm.1992.307346 ◽

1992 ◽

Cited By ~ 8

Author(s):

Nguyen ◽

Smithe ◽

Ludeking

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Universal description of hot-carrier-induced interface states in NMOSFETs

International Technical Digest on Electron Devices Meeting ◽

10.1109/iedm.1992.307418 ◽

1992 ◽

Cited By ~ 15

Author(s):

Woltjer ◽

Paulzen

Keyword(s):

Interface States ◽

Hot Carrier

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Phase-shifting mask topography effects on lithographic image quality

International Technical Digest on Electron Devices Meeting ◽

10.1109/iedm.1992.307307 ◽

1992 ◽

Cited By ~ 8

Author(s):

Pierrat ◽

Wong ◽

Vaidya

Keyword(s):

Image Quality ◽

Phase Shifting

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A novel electron emitter with AlGaAs planar doped barrier

International Technical Digest on Electron Devices Meeting ◽

10.1109/iedm.1992.307522 ◽

1992 ◽

Author(s):

Jiang ◽

Mishra

Keyword(s):

Electron Emitter

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Challenges in excimer laser lithography for 256M DRAM and beyond

International Technical Digest on Electron Devices Meeting ◽

10.1109/iedm.1992.307305 ◽

1992 ◽

Cited By ~ 2

Author(s):

Endo ◽

Hashimoto ◽

Yamashita ◽

Katsuyama ◽

Matsuo ◽

...

Keyword(s):

Excimer Laser ◽

Laser Lithography

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Jitter suppression in a CFA by the use of a field emitter array

International Technical Digest on Electron Devices Meeting ◽

10.1109/iedm.1992.307511 ◽

1992 ◽

Author(s):

Vaughan ◽

Ramacher ◽

Bergeron

Keyword(s):

Field Emitter ◽

Emitter Array ◽

Field Emitter Array

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International Technical Digest on Electron Devices MeetingLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Field emission imaging study of silicon field emitters

Quasi-SOI MOSFETs using selective epitaxy and polishing

Hot-carrier degradation of p-MOSFET's in analog operation: the relevance of the channel-length-independent drain conductance degradation

New CMOS shallow junction well FET structure (CMOS-SJET) for low power-supply voltage

The double-cusp gyro-gun

Universal description of hot-carrier-induced interface states in NMOSFETs

Phase-shifting mask topography effects on lithographic image quality

A novel electron emitter with AlGaAs planar doped barrier

Challenges in excimer laser lithography for 256M DRAM and beyond

Jitter suppression in a CFA by the use of a field emitter array

International Technical Digest on Electron Devices Meeting
Latest Publications