Improved Built-In Self-Test of Sequential Circuits
2001 ◽
Vol 9
(2)
◽
pp. 290-296
◽
Keyword(s):
International Journal of Advanced Research in Electrical Electronics and Instrumentation Engineering
◽
2014 ◽
Vol 03
(08)
◽
pp. 11487-11495
Keyword(s):
2019 ◽
Vol 24
(3)
◽
pp. 239-247
2021 ◽
Vol 26
(3)
◽
pp. 1-18
Keyword(s):