A built-in self-test method for diagnosis of synchronous sequential circuits

2001 ◽  
Vol 9 (2) ◽  
pp. 290-296 ◽  
Author(s):  
I. Pomeranz ◽  
S.M. Reddy
Keyword(s):  
Sequential Circuits ◽  
Test Method ◽  
Synchronous Sequential Circuits ◽  
Self Test ◽  
Built In Self Test

A low-cost built-in self-test method for thermally actuated resistive MEMS sensors

2013 ◽  
Vol 194 ◽  
pp. 8-15 ◽  
Author(s):  
O. Legendre ◽  
H. Bertin ◽  
H. Mathias ◽  
S. Megherbi ◽  
J. Juillard ◽  
...  
Keyword(s):  
Low Cost ◽  
Test Method ◽  
Mems Sensors ◽  
Self Test ◽  
Built In Self Test ◽  
Thermally Actuated

A Delay-Adjustable, Self-Testable Flip-Flop for Soft-Error Tolerability and Delay-Fault Testability

2021 ◽  
Vol 26 (6) ◽  
pp. 1-12
Author(s):  
Dave Y.-W. Lin ◽  
Charles H.-P. Wen
Keyword(s):  
Energy Levels ◽  
Soft Error ◽  
Test Method ◽  
Experimental Result ◽  
Flip Flop ◽  
Area Overhead ◽  
Design Reliability ◽  
Radiation Hardened ◽  
Self Test ◽  
Built In Self Test

As the demand of safety-critical applications (e.g., automobile electronics) increases, various radiation-hardened flip-flops are proposed for enhancing design reliability. Among all flip-flops, Delay-Adjustable D-Flip-Flop (DAD-FF) is specialized in arbitrarily adjusting delay in the design to tolerate soft errors induced by different energy levels. However, due to a lack of testability on DAD-FF, its soft-error tolerability is not yet verified, leading to uncertain design reliability. Therefore, this work proposes Delay-Adjustable, Self-Testable Flip-Flop (DAST-FF), built on top of DAD-FF with two extra MUXs (one for scan test and the other for latching-delay verification) to achieve both soft-error tolerability and testability. Meanwhile, a built-in self-test method is also developed on DAST-FFs to verify the cumulative latching delay before operation. The experimental result shows that for a design with 8,802 DAST-FFs, the built-in self-test method only takes 946 ns to ensure the soft-error tolerability. As to the testability, the enhanced scan capability can be enabled by inserting one extra transmission gate into DAST-FF with only 4.5 area overhead.

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