Enhanced degradation in polycrystalline silicon thin-film transistors under dynamic hot-carrier stress

Kow Ming Chang;  Yuan Hung Chung;  Gin Ming Lin;  Chi Gun Deng;  Jian Hong Lin

doi:10.1109/55.954916

Enhanced degradation in polycrystalline silicon thin-film transistors under dynamic hot-carrier stress

IEEE Electron Device Letters ◽

10.1109/55.954916 ◽

2001 ◽

Vol 22 (10) ◽

pp. 475-477 ◽

Cited By ~ 28

Author(s):

Kow Ming Chang ◽

Yuan Hung Chung ◽

Gin Ming Lin ◽

Chi Gun Deng ◽

Jian Hong Lin

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Silicon Thin Film ◽

Hot Carrier ◽

Hot Carrier Stress ◽

Enhanced Degradation

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Anomalous turn-on voltage degradation during hot-carrier stress in polycrystalline silicon thin-film transistors

IEEE Electron Device Letters ◽

10.1109/55.902836 ◽

2001 ◽

Vol 22 (2) ◽

pp. 74-76 ◽

Cited By ~ 64

Author(s):

F.V. Farmakis ◽

J. Brini ◽

G. Kamarinos ◽

C.A. Dimitriadis

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Silicon Thin Film ◽

Hot Carrier ◽

Turn On ◽

Hot Carrier Stress ◽

Voltage Degradation

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Hot-Carrier Degradation and Electric Field and Electron Concentration near Drain Junction in Low-Temperature N-Channel Single Drain and Lightly Doped Drain Polycrystalline Silicon Thin Film Transistors

Japanese Journal of Applied Physics ◽

10.1143/jjap.46.1322 ◽

2007 ◽

Vol 46 (3B) ◽

pp. 1322-1327 ◽

Cited By ~ 5

Author(s):

Gen Usami ◽

Yukisato Nogami ◽

Toshihisa Yajima ◽

Masahiro Yamagata ◽

Toshifumi Satoh ◽

...

Keyword(s):

Thin Film ◽

Low Temperature ◽

Electric Field ◽

Electron Concentration ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Silicon Thin Film ◽

Hot Carrier ◽

Lightly Doped Drain ◽

Hot Carrier Degradation

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Hot-Carrier Effects in Short Channel (L= 1.5 µm) p-Type Polycrystalline Silicon Thin-Film Transistors

Japanese Journal of Applied Physics ◽

10.7567/jjap.51.024103 ◽

2012 ◽

Vol 51 (2R) ◽

pp. 024103

Author(s):

Sung-Hwan Choi ◽

Yeon-Gon Mo ◽

Hye-Dong Kim ◽

Min-Koo Han

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Silicon Thin Film ◽

Short Channel ◽

Hot Carrier ◽

Hot Carrier Effects ◽

P Type

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Degradation Mechanism for Continuous-Wave Green Laser-Crystallized Polycrystalline Silicon n-Channel Thin-Film Transistors under Low Vertical-Field Hot-Carrier Stress with Different Laser Annealing Powers

Japanese Journal of Applied Physics ◽

10.1143/jjap.50.04dh16 ◽

2011 ◽

Vol 50 (4) ◽

pp. 04DH16 ◽

Cited By ~ 1

Author(s):

Mu-Chun Wang ◽

Hsin-Chia Yang ◽

Hong-Wen Hsu ◽

Zhen-Ying Hsieh ◽

Shuang-Yuan Chen ◽

...

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Laser Annealing ◽

Continuous Wave ◽

Degradation Mechanism ◽

Green Laser ◽

Hot Carrier ◽

Vertical Field ◽

Hot Carrier Stress

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Analysis of Hot-Carrier Effects, 'Kink' Effect and Low Frequency Noise in Polycrystalline Silicon Thin-Film Transistors

Solid State Phenomena ◽

10.4028/www.scientific.net/ssp.51-52.585 ◽

1996 ◽

Vol 51-52 ◽

pp. 585-596 ◽

Cited By ~ 5

Author(s):

G. Fortunato

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Low Frequency ◽

Frequency Noise ◽

Low Frequency Noise ◽

Silicon Thin Film ◽

Hot Carrier ◽

Kink Effect ◽

Hot Carrier Effects

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Effective density-of-states distribution of polycrystalline silicon thin-film transistors under hot-carrier degradation

Journal of Applied Physics ◽

10.1063/1.2777804 ◽

2007 ◽

Vol 102 (5) ◽

pp. 054508 ◽

Cited By ~ 15

Author(s):

Ming-Hsien Lee ◽

Kai-Hsiang Chang ◽

Horng-Chih Lin

Keyword(s):

Thin Film ◽

Density Of States ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Effective Density ◽

Silicon Thin Film ◽

Hot Carrier ◽

Hot Carrier Degradation

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The Characteristics of Hot-Carrier Stressed Bottom-Gate Polycrystalline Silicon Thin-Film Transistors Employing Alternating Magnetic-Field-Enhanced Rapid Thermal Annealing

ECS Meeting Abstracts ◽

10.1149/ma2008-02/35/2266 ◽

2008 ◽

Keyword(s):

Magnetic Field ◽

Thin Film ◽

Thermal Annealing ◽

Rapid Thermal Annealing ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Alternating Magnetic Field ◽

Silicon Thin Film ◽

Hot Carrier ◽

Bottom Gate

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Temperature Dependence of Performance and Hot-Carrier Immunity in Low-Temperature Polycrystalline Silicon Thin-Film Transistors

Japanese Journal of Applied Physics ◽

10.1143/jjap.49.084101 ◽

2010 ◽

Vol 49 (8) ◽

pp. 084101

Author(s):

Mieko Matsumura ◽

Yoshiaki Toyota ◽

Mutsuko Hatano ◽

Makoto Ohkura

Keyword(s):

Thin Film ◽

Low Temperature ◽

Temperature Dependence ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Silicon Thin Film ◽

Hot Carrier

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The Characteristics of Hot-Carrier Stressed Bottom-Gate Polycrystalline Silicon Thin-Film Transistors Employing Alternating Magnetic-Field-Enhanced Rapid Thermal Annealing

ECS Transactions ◽

10.1149/1.2980532 ◽

2019 ◽

Vol 16 (9) ◽

pp. 67-72

Author(s):

Won-Kyu Lee ◽

Hee-Sun Shin ◽

Kyusik Cho ◽

Joonhoo Choi ◽

Chi-Woo Kim ◽

...

Keyword(s):

Magnetic Field ◽

Thin Film ◽

Thermal Annealing ◽

Rapid Thermal Annealing ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Alternating Magnetic Field ◽

Silicon Thin Film ◽

Hot Carrier ◽

Bottom Gate

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Anomalous hot-carrier-induced degradation of offset gated polycrystalline silicon thin-film transistors

Applied Physics Letters ◽

10.1063/1.1707222 ◽

2004 ◽

Vol 84 (16) ◽

pp. 3163-3165

Author(s):

A. Hatzopoulos ◽

C. A. Dimitriadis ◽

G. Pananakakis ◽

G. Ghibaudo ◽

G. Kamarinos

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Silicon Thin Film ◽

Hot Carrier

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