Effective density-of-states distribution of polycrystalline silicon thin-film transistors under hot-carrier degradation

2007 ◽  
Vol 102 (5) ◽  
pp. 054508 ◽  
Author(s):  
Ming-Hsien Lee ◽  
Kai-Hsiang Chang ◽  
Horng-Chih Lin
Keyword(s):  
Thin Film ◽  
Density Of States ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Effective Density ◽  
Silicon Thin Film ◽  
Hot Carrier ◽  
Hot Carrier Degradation

Grain-Boundary Related Hot Carrier Degradation Mechanism in Low-Temperature Polycrystalline Silicon Thin-Film Transistors

2003 ◽  
Vol 42 (Part 1, No. 4B) ◽  
pp. 1999-2003 ◽  
Author(s):  
Toshiyuki Yoshida ◽  
Yoshiki Ebiko ◽  
Michiko Takei ◽  
Nobuo Sasaki ◽  
Toshiaki Tsuchiya
Keyword(s):  
Thin Film ◽  
Low Temperature ◽  
Grain Boundary ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Degradation Mechanism ◽  
Silicon Thin Film ◽  
Hot Carrier ◽  
Hot Carrier Degradation

Density of states in the channel material of low temperature polycrystalline silicon thin film transistors

2000 ◽  
Vol 266-269 ◽  
pp. 1279-1283 ◽  
Author(s):  
K Mourgues ◽  
A Rahal ◽  
T Mohammed-Brahim ◽  
M Sarret ◽  
J.P Kleider ◽  
...  
Keyword(s):  
Thin Film ◽  
Low Temperature ◽  
Density Of States ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Silicon Thin Film
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