Anomalous hot-carrier-induced degradation of offset gated polycrystalline silicon thin-film transistors

2004 ◽  
Vol 84 (16) ◽  
pp. 3163-3165
Author(s):  
A. Hatzopoulos ◽  
C. A. Dimitriadis ◽  
G. Pananakakis ◽  
G. Ghibaudo ◽  
G. Kamarinos
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Silicon Thin Film ◽  
Hot Carrier

scholarly journals Enhanced degradation in polycrystalline silicon thin-film transistors under dynamic hot-carrier stress

2001 ◽  
Vol 22 (10) ◽  
pp. 475-477 ◽  
Author(s):  
Kow Ming Chang ◽  
Yuan Hung Chung ◽  
Gin Ming Lin ◽  
Chi Gun Deng ◽  
Jian Hong Lin
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Silicon Thin Film ◽  
Hot Carrier ◽  
Hot Carrier Stress ◽  
Enhanced Degradation

Hot Carrier Effects in p-Channel Polycrystalline Silicon Thin Film Transistors Fabricated on Flexible Substrates

2007 ◽  
Vol 46 (3B) ◽  
pp. 1299-1302 ◽  
Author(s):  
Luigi Mariucci ◽  
Paolo Gaucci ◽  
Antonio Valletta ◽  
François Templier ◽  
Guglielmo Fortunato
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Flexible Substrates ◽  
Silicon Thin Film ◽  
Hot Carrier ◽  
Hot Carrier Effects
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