Anomalous turn-on voltage degradation during hot-carrier stress in polycrystalline silicon thin-film transistors

2001 ◽  
Vol 22 (2) ◽  
pp. 74-76 ◽  
Author(s):  
F.V. Farmakis ◽  
J. Brini ◽  
G. Kamarinos ◽  
C.A. Dimitriadis
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Silicon Thin Film ◽  
Hot Carrier ◽  
Turn On ◽  
Hot Carrier Stress ◽  
Voltage Degradation

scholarly journals Enhanced degradation in polycrystalline silicon thin-film transistors under dynamic hot-carrier stress

2001 ◽  
Vol 22 (10) ◽  
pp. 475-477 ◽  
Author(s):  
Kow Ming Chang ◽  
Yuan Hung Chung ◽  
Gin Ming Lin ◽  
Chi Gun Deng ◽  
Jian Hong Lin
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Silicon Thin Film ◽  
Hot Carrier ◽  
Hot Carrier Stress ◽  
Enhanced Degradation

Anomalous hot-carrier-induced degradation of offset gated polycrystalline silicon thin-film transistors

2004 ◽  
Vol 84 (16) ◽  
pp. 3163-3165
Author(s):  
A. Hatzopoulos ◽  
C. A. Dimitriadis ◽  
G. Pananakakis ◽  
G. Ghibaudo ◽  
G. Kamarinos
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Silicon Thin Film ◽  
Hot Carrier
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