Lateral distribution of hot-carrier-induced interface traps in MOSFETs

M.G. Ancona; N.S. Saks; D. McCarthy

doi:10.1109/16.8796

Lateral distribution of hot-carrier-induced interface traps in MOSFETs

IEEE Transactions on Electron Devices ◽

10.1109/16.8796 ◽

1988 ◽

Vol 35 (12) ◽

pp. 2221-2228 ◽

Cited By ~ 144

Author(s):

M.G. Ancona ◽

N.S. Saks ◽

D. McCarthy

Keyword(s):

Lateral Distribution ◽

Interface Traps ◽

Hot Carrier

Download Full-text

Lateral distribution of hot-carrier-induced oxide charge and interface traps in MOSFET's

1991 International Symposium on VLSI Technology, Systems, and Applications - Proceedings of Technical Papers ◽

10.1109/vtsa.1991.246683 ◽

2002 ◽

Author(s):

W. Chen ◽

A. Balasinski ◽

T.-P. Ma

Keyword(s):

Lateral Distribution ◽

Interface Traps ◽

Oxide Charge ◽

Hot Carrier

Download Full-text

Calculation of lateral distribution of interface traps along MIS channel

Electronics Letters ◽

10.1049/el:19910906 ◽

1991 ◽

Vol 27 (16) ◽

pp. 1445 ◽

Cited By ~ 2

Author(s):

A.K. Henning ◽

J.A. Dimauro

Keyword(s):

Lateral Distribution ◽

Interface Traps

Download Full-text

Generation of Hot-Carrier Induced Border and Interface Traps, Investigated by Spectroscopic Charge Pumping

2020 IEEE International Reliability Physics Symposium (IRPS) ◽

10.1109/irps45951.2020.9129513 ◽

2020 ◽

Cited By ~ 1

Author(s):

Bernhard Ruch ◽

Gregor Pobegen ◽

Christian Schleich ◽

Tibor Grasser

Keyword(s):

Interface Traps ◽

Charge Pumping ◽

Hot Carrier

Download Full-text

Two types of interface traps induced by hot-carrier stressing in MOSFETs

Solid-State Electronics ◽

10.1016/0038-1101(93)90019-m ◽

1993 ◽

Vol 36 (6) ◽

pp. 936-938

Author(s):

N.C. Das ◽

V. Nathan

Keyword(s):

Interface Traps ◽

Hot Carrier

Download Full-text

1/f noise in hot-carrier damaged MOSFET's: effects of oxide charge and interface traps

IEEE Electron Device Letters ◽

10.1109/55.215185 ◽

1993 ◽

Vol 14 (5) ◽

pp. 256-258 ◽

Cited By ~ 34

Author(s):

M.-H. Tsai ◽

T.-P. Ma

Keyword(s):

Interface Traps ◽

Oxide Charge ◽

Hot Carrier

Download Full-text

The Generation Process of Interface Traps by Hot-Carrier Injection in Nanoscale Metal–Oxide–Semiconductor Field-Effect Transistors

Japanese Journal of Applied Physics ◽

10.1143/jjap.51.02bc09 ◽

2012 ◽

Vol 51 (2) ◽

pp. 02BC09 ◽

Cited By ~ 2

Author(s):

Ming Hu ◽

Takuya Yamane ◽

Toshiaki Tsuchiya

Keyword(s):

Metal Oxide ◽

Field Effect ◽

Field Effect Transistors ◽

Metal Oxide Semiconductor ◽

Oxide Semiconductor ◽

Generation Process ◽

Interface Traps ◽

Carrier Injection ◽

Hot Carrier ◽

Hot Carrier Injection

Download Full-text

Effects of interface traps and bulk traps in SiO/sub 2/ on hot-carrier-induced degradation

Proceedings of the 1989 International Conference on Microelectronic Test Structures ◽

10.1109/icmts.1989.39292 ◽

2003 ◽

Cited By ~ 1

Author(s):

H. Uchida ◽

S. Inomata ◽

T. Ajioka

Keyword(s):

Interface Traps ◽

Hot Carrier

Download Full-text

Accurate measurements for lateral distribution of interface traps by charge pumping and capacitance methods

Proceedings of International Electron Devices Meeting ◽

10.1109/iedm.1995.497178 ◽

2002 ◽

Cited By ~ 4

Author(s):

H. Uchida ◽

K. Fukuda ◽

H. Tanaka ◽

N. Hirashita

Keyword(s):

Lateral Distribution ◽

Interface Traps ◽

Charge Pumping

Download Full-text

Minimized Constrains for Lateral Profiling of Hot-Carrier-Induced Oxide Charge and Interface Traps in MOSFETs

IEEE Electron Device Letters ◽

10.1109/led.2003.822653 ◽

2004 ◽

Vol 25 (2) ◽

pp. 98-100 ◽

Cited By ~ 2

Author(s):

C.-Y. Lu ◽

K.-S. Chang-Liao

Keyword(s):

Interface Traps ◽

Oxide Charge ◽

Hot Carrier

Download Full-text

On the effect of interface traps on the carrier distribution function during hot-carrier degradation

2016 IEEE International Integrated Reliability Workshop (IIRW) ◽

10.1109/iirw.2016.7904911 ◽

2016 ◽

Cited By ~ 1

Author(s):

S.E. Tyaginov ◽

A. Makarov ◽

M. Jech ◽

J. Franco ◽

P. Sharma ◽

...

Keyword(s):

Distribution Function ◽

Interface Traps ◽

Carrier Distribution ◽

Hot Carrier ◽

Hot Carrier Degradation

Download Full-text