Calculation of lateral distribution of interface traps along MIS channel

A.K. Henning; J.A. Dimauro

doi:10.1049/el:19910906

Calculation of lateral distribution of interface traps along MIS channel

Electronics Letters ◽

10.1049/el:19910906 ◽

1991 ◽

Vol 27 (16) ◽

pp. 1445 ◽

Cited By ~ 2

Author(s):

A.K. Henning ◽

J.A. Dimauro

Keyword(s):

Lateral Distribution ◽

Interface Traps

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Lateral distribution of hot-carrier-induced interface traps in MOSFETs

IEEE Transactions on Electron Devices ◽

10.1109/16.8796 ◽

1988 ◽

Vol 35 (12) ◽

pp. 2221-2228 ◽

Cited By ~ 144

Author(s):

M.G. Ancona ◽

N.S. Saks ◽

D. McCarthy

Keyword(s):

Lateral Distribution ◽

Interface Traps ◽

Hot Carrier

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Accurate measurements for lateral distribution of interface traps by charge pumping and capacitance methods

Proceedings of International Electron Devices Meeting ◽

10.1109/iedm.1995.497178 ◽

2002 ◽

Cited By ~ 4

Author(s):

H. Uchida ◽

K. Fukuda ◽

H. Tanaka ◽

N. Hirashita

Keyword(s):

Lateral Distribution ◽

Interface Traps ◽

Charge Pumping

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Extraction of the lateral distribution of interface traps in MOSFETs by a novel combined gated-diode technique

Microelectronics Reliability ◽

10.1016/s0026-2714(01)00235-9 ◽

2001 ◽

Vol 41 (12) ◽

pp. 1953-1957 ◽

Cited By ~ 1

Author(s):

Jin He ◽

Xing Zhang ◽

Ru Huang ◽

Yangyuan Wang

Keyword(s):

Lateral Distribution ◽

Interface Traps

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A novel experimental technique: combined gated-diode method for extracting lateral distribution of interface traps in SOI NMOSFETs

Solid-State Electronics ◽

10.1016/s0038-1101(01)00140-x ◽

2001 ◽

Vol 45 (7) ◽

pp. 1107-1113 ◽

Cited By ~ 2

Author(s):

Jin He ◽

Xing Zhang ◽

Ai-hua Huang ◽

Ru Huang

Keyword(s):

Experimental Technique ◽

Lateral Distribution ◽

Interface Traps

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Lateral distribution of hot-carrier-induced oxide charge and interface traps in MOSFET's

1991 International Symposium on VLSI Technology, Systems, and Applications - Proceedings of Technical Papers ◽

10.1109/vtsa.1991.246683 ◽

2002 ◽

Author(s):

W. Chen ◽

A. Balasinski ◽

T.-P. Ma

Keyword(s):

Lateral Distribution ◽

Interface Traps ◽

Oxide Charge ◽

Hot Carrier

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A new technique for measuring lateral distribution of oxide charge and interface traps near MOSFET junctions

IEEE Electron Device Letters ◽

10.1109/55.103618 ◽

1991 ◽

Vol 12 (7) ◽

pp. 393-395 ◽

Cited By ~ 32

Author(s):

W. Chen ◽

T.-P. Ma

Keyword(s):

Lateral Distribution ◽

New Technique ◽

Interface Traps ◽

Oxide Charge ◽

A New Technique

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Discrimination between volume and interface traps in C (V) and photo I(V) experiments on 10-30 nm MOS capacitors

Journal de Physique III ◽

10.1051/jp3:1993263 ◽

1993 ◽

Vol 3 (11) ◽

pp. 2101-2112

Author(s):

J. Peisner ◽

Y. Sangare ◽

G. Lévêque

Keyword(s):

Interface Traps ◽

Mos Capacitors

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Effects of Pressure on Lipid Lateral Distribution in Membranes

10.21236/ada244722 ◽

1991 ◽

Author(s):

Parkson L. Chong ◽

Istvan P. Sugar

Keyword(s):

Lateral Distribution

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Layering Concept for Wave Shaping and Lateral Distribution of Stresses During Impact

10.21236/ada394098 ◽

2001 ◽

Author(s):

J. L. Ding ◽

Y. M. Gupta

Keyword(s):

Lateral Distribution ◽

Distribution Of Stresses

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2D MoS 2 Charge Injection Memory Transistors Utilizing Hetero‐Stack SiO 2 /HfO 2 Dielectrics and Oxide Interface Traps

Advanced Electronic Materials ◽

10.1002/aelm.202100074 ◽

2021 ◽

pp. 2100074

Author(s):

Livia Janice Widiapradja ◽

Taewook Nam ◽

Yeonsu Jeong ◽

Hye‐Jin Jin ◽

Yangjin Lee ◽

...

Keyword(s):

Charge Injection ◽

Interface Traps ◽

Oxide Interface

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