Proceedings of the 1989 International Conference on Microelectronic Test Structures
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Novel test structure to study location of breakdown for trench capacitor

Proceedings of the 1989 International Conference on Microelectronic Test Structures ◽

10.1109/icmts.1989.39317 ◽

2003 ◽

Cited By ~ 3

Author(s):

K. Kishi ◽

T. Yoshida ◽

T. Watanabe ◽

T. Tanaka ◽

S. Shinozaki

Keyword(s):

Test Structure

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Effects of interface traps and bulk traps in SiO/sub 2/ on hot-carrier-induced degradation

Proceedings of the 1989 International Conference on Microelectronic Test Structures ◽

10.1109/icmts.1989.39292 ◽

2003 ◽

Cited By ~ 1

Author(s):

H. Uchida ◽

S. Inomata ◽

T. Ajioka

Keyword(s):

Interface Traps ◽

Hot Carrier

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High speed measurement of FET V/sub th/ at low I/sub d/

Proceedings of the 1989 International Conference on Microelectronic Test Structures ◽

10.1109/icmts.1989.39276 ◽

2003 ◽

Author(s):

H. Norimatsu

Keyword(s):

High Speed ◽

Speed Measurement

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The effect of contact geometry on the value of contact resistivity extracted from Kelvin structures

Proceedings of the 1989 International Conference on Microelectronic Test Structures ◽

10.1109/icmts.1989.39297 ◽

2003 ◽

Cited By ~ 9

Author(s):

K.W.J. Findlay ◽

W.J.C. Alexander ◽

A.J. Walton

Keyword(s):

Contact Geometry ◽

Contact Resistivity

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Design and implementation of channel mobility measurement modules

Proceedings of the 1989 International Conference on Microelectronic Test Structures ◽

10.1109/icmts.1989.39303 ◽

2003 ◽

Author(s):

G.J.L. Ouwerling ◽

J.C. Staalenburg

Keyword(s):

Channel Mobility ◽

Design And Implementation ◽

Mobility Measurement

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Enhanced MOS parameter extraction and SPICE modelling for mixed analogue and digital circuit simulation

Proceedings of the 1989 International Conference on Microelectronic Test Structures ◽

10.1109/icmts.1989.39285 ◽

2003 ◽

Cited By ~ 7

Author(s):

B. Ankele ◽

W. Holzl ◽

P. O'Leary

Keyword(s):

Circuit Simulation ◽

Parameter Extraction ◽

Digital Circuit

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A fast measurement technique for the determination of small signal parameters of the bipolar transistor

Proceedings of the 1989 International Conference on Microelectronic Test Structures ◽

10.1109/icmts.1989.39287 ◽

2003 ◽

Cited By ~ 2

Author(s):

P. Vandeloo

Keyword(s):

Measurement Technique ◽

Bipolar Transistor ◽

Small Signal ◽

Fast Measurement ◽

Signal Parameters

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Inverter propagation delay measurements using timing sampler circuits

Proceedings of the 1989 International Conference on Microelectronic Test Structures ◽

10.1109/icmts.1989.39314 ◽

2003 ◽

Cited By ~ 3

Author(s):

B.R. Blaes ◽

M.G. Buehler

Keyword(s):

Propagation Delay

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An experimental measurement technique of interconnection RC delay for integrated circuits using the step voltage response

Proceedings of the 1989 International Conference on Microelectronic Test Structures ◽

10.1109/icmts.1989.39315 ◽

2003 ◽

Author(s):

S.G. dos Santos F. ◽

J.W. Swart

Keyword(s):

Integrated Circuits ◽

Measurement Technique ◽

Experimental Measurement ◽

Voltage Response ◽

Step Voltage ◽

Rc Delay

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Automatic parameter extraction system with process failure diagnostics for CMOS process

Proceedings of the 1989 International Conference on Microelectronic Test Structures ◽

10.1109/icmts.1989.39310 ◽

2003 ◽

Author(s):

J. Pieczynski ◽

H. Vogt

Keyword(s):

Parameter Extraction ◽

Extraction System ◽

Cmos Process ◽

Process Failure

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Proceedings of the 1989 International Conference on Microelectronic Test StructuresLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Novel test structure to study location of breakdown for trench capacitor

Effects of interface traps and bulk traps in SiO/sub 2/ on hot-carrier-induced degradation

High speed measurement of FET V/sub th/ at low I/sub d/

The effect of contact geometry on the value of contact resistivity extracted from Kelvin structures

Design and implementation of channel mobility measurement modules

Enhanced MOS parameter extraction and SPICE modelling for mixed analogue and digital circuit simulation

A fast measurement technique for the determination of small signal parameters of the bipolar transistor

Inverter propagation delay measurements using timing sampler circuits

An experimental measurement technique of interconnection RC delay for integrated circuits using the step voltage response

Automatic parameter extraction system with process failure diagnostics for CMOS process

Proceedings of the 1989 International Conference on Microelectronic Test Structures
Latest Publications