Accurate evaluation of Ge metal—insulator—semiconductor interface properties

2011 ◽  
Vol 110 (6) ◽  
pp. 064506 ◽  
Author(s):  
Noriyuki Taoka ◽  
Keiji Ikeda ◽  
Wataru Mizubayashi ◽  
Yukinori Morita ◽  
Shinji Migita ◽  
...  
Keyword(s):  
Interface Properties ◽  
Semiconductor Interface ◽  
Metal Insulator ◽  
Metal Insulator Semiconductor ◽  
Accurate Evaluation

Effects of Si passivation on Ge metal-insulator-semiconductor interface properties and inversion-layer hole mobility

2008 ◽  
Vol 92 (11) ◽  
pp. 113511 ◽  
Author(s):  
Noriyuki Taoka ◽  
Masatomi Harada ◽  
Yoshimi Yamashita ◽  
Toyoji Yamamoto ◽  
Naoharu Sugiyama ◽  
...  
Keyword(s):  
Inversion Layer ◽  
Hole Mobility ◽  
Interface Properties ◽  
Semiconductor Interface ◽  
Metal Insulator ◽  
Metal Insulator Semiconductor ◽  
And Inversion

Ultra-Strong Mode Confinement at Semishell Metal/insulator/semiconductor Interface for Nanolaser

2021 ◽  
pp. 118242
Author(s):  
Ru Wang ◽  
Chunxiang Xu ◽  
Daotong You ◽  
Xiaoxuan Wang ◽  
Jinping Chen ◽  
...  
Keyword(s):  
Semiconductor Interface ◽  
Metal Insulator ◽  
Metal Insulator Semiconductor ◽  
Strong Mode

Interface properties of HgCdTe metal‐insulator‐semiconductor capacitors

1989 ◽  
Vol 54 (3) ◽  
pp. 265-267 ◽  
Author(s):  
M. J. Yang ◽  
C. H. Yang ◽  
M. A. Kinch ◽  
J. D. Beck
Keyword(s):  
Interface Properties ◽  
Metal Insulator ◽  
Metal Insulator Semiconductor

Importance of minority carrier response in accurate characterization of Ge metal-insulator-semiconductor interface traps

2009 ◽  
Vol 106 (4) ◽  
pp. 044506 ◽  
Author(s):  
Noriyuki Taoka ◽  
Toyoji Yamamoto ◽  
Masatomi Harada ◽  
Yoshimi Yamashita ◽  
Naoharu Sugiyama ◽  
...  
Keyword(s):  
Minority Carrier ◽  
Interface Traps ◽  
Semiconductor Interface ◽  
Metal Insulator ◽  
Metal Insulator Semiconductor
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