Determination of band offsets in strained InAsxP1−x/InP quantum well by capacitance voltage profile and photoluminescence spectroscopy
Keyword(s):
1997 ◽
Vol 26
(2)
◽
pp. L6-L8
◽
Keyword(s):
2009 ◽
Vol 6
(6)
◽
pp. 1517-1519
◽
2010 ◽
Vol 28
(3)
◽
pp. C3I6-C3I9
◽
Keyword(s):
Keyword(s):