Electrical characteristics of DNA-based metal-insulator-semiconductor structures

S. Sönmezoğlu; Ö. Ateş Sönmezoğlu; G. Çankaya; A. Yıldırım; N. Serin

doi:10.1063/1.3447985

Electrical characteristics of DNA-based metal-insulator-semiconductor structures

Journal of Applied Physics ◽

10.1063/1.3447985 ◽

2010 ◽

Vol 107 (12) ◽

pp. 124518 ◽

Cited By ~ 36

Author(s):

S. Sönmezoğlu ◽

Ö. Ateş Sönmezoğlu ◽

G. Çankaya ◽

A. Yıldırım ◽

N. Serin

Keyword(s):

Electrical Characteristics ◽

Metal Insulator ◽

Metal Insulator Semiconductor ◽

Semiconductor Structures

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Electrical characteristics of plasma‐deposited diamondlike carbon/silicon metal–insulator–semiconductor structures

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.577875 ◽

1992 ◽

Vol 10 (5) ◽

pp. 3125-3130 ◽

Cited By ~ 10

Author(s):

Jayshree Seth ◽

M. I. Chaudhry ◽

S. V. Babu

Keyword(s):

Electrical Characteristics ◽

Metal Insulator ◽

Metal Insulator Semiconductor ◽

Semiconductor Structures ◽

Diamondlike Carbon

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Electrical characteristics of Au/Ti/HfO2/n-GaAs metal-insulator-semiconductor structures with high-k interfacial layer

International Journal of Chemistry and Technology ◽

10.32571/ijct.456902 ◽

2018 ◽

Vol 2 (2) ◽

Cited By ~ 6

Author(s):

Abdulkerim KARABULUT ◽

İkram ORAK ◽

Abdülmecit TÜRÜT

Keyword(s):

Interfacial Layer ◽

Electrical Characteristics ◽

Metal Insulator ◽

Metal Insulator Semiconductor ◽

Semiconductor Structures ◽

High K

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Electrical characteristics of ZrO2-based metal-insulator-semiconductor structures on p-Si

Thin Solid Films ◽

10.1016/0040-6090(92)90122-r ◽

1992 ◽

Vol 207 (1-2) ◽

pp. 193-196 ◽

Cited By ~ 25

Author(s):

T.S. Kalkur ◽

Y.C. Lu

Keyword(s):

Electrical Characteristics ◽

Metal Insulator ◽

Metal Insulator Semiconductor ◽

Semiconductor Structures

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Electrical characteristics of metal-insulator-semiconductor structures with atomic layer deposited Al2O3, HfO2, and nanolaminates on different silicon substrates

Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena ◽

10.1116/1.3532544 ◽

2011 ◽

Vol 29 (1) ◽

pp. 01AA07 ◽

Cited By ~ 33

Author(s):

F. Campabadal ◽

J. M. Rafí ◽

M. Zabala ◽

O. Beldarrain ◽

A. Faigón ◽

...

Keyword(s):

Atomic Layer ◽

Silicon Substrates ◽

Electrical Characteristics ◽

Metal Insulator ◽

Metal Insulator Semiconductor ◽

Semiconductor Structures

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Influence of ultrashort pulses of electromagnetic radiation on parameters of metal-insulator-semiconductor structures

Semiconductors ◽

10.1134/1.1836058 ◽

2004 ◽

Vol 38 (12) ◽

pp. 1390-1393

Author(s):

V. A. Terekhov ◽

A. N. Man’ko ◽

E. N. Bormontov ◽

V. N. Levchenko ◽

S. Yu. Trebunskikh ◽

...

Keyword(s):

Electromagnetic Radiation ◽

Ultrashort Pulses ◽

Metal Insulator ◽

Metal Insulator Semiconductor ◽

Semiconductor Structures

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Electron trapping in metal-insulator-semiconductor structures on n-GaN with SiO2 and Si3N4 dielectrics

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.1806439 ◽

2004 ◽

Vol 22 (6) ◽

pp. 2379-2383 ◽

Cited By ~ 24

Author(s):

Choelhwyi Bae ◽

Cristiano Krug ◽

Gerald Lucovsky

Keyword(s):

Electron Trapping ◽

Metal Insulator ◽

Metal Insulator Semiconductor ◽

Semiconductor Structures

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Role of the dielectric for the charging dynamics of the dielectric/barrier interface in AlGaN/GaN based metal-insulator-semiconductor structures under forward gate bias stress

Applied Physics Letters ◽

10.1063/1.4891532 ◽

2014 ◽

Vol 105 (3) ◽

pp. 033512 ◽

Cited By ~ 52

Author(s):

P. Lagger ◽

P. Steinschifter ◽

M. Reiner ◽

M. Stadtmüller ◽

G. Denifl ◽

...

Keyword(s):

Gate Bias ◽

Metal Insulator ◽

Dielectric Barrier ◽

Metal Insulator Semiconductor ◽

Bias Stress ◽

Semiconductor Structures ◽

Charging Dynamics ◽

Gate Bias Stress

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Characterization of interface electrical properties in SiO2/InSb metal/insulator/semiconductor structures prepared by plasma-enhanced chemical vapour deposition

Thin Solid Films ◽

10.1016/0040-6090(87)90317-8 ◽

1987 ◽

Vol 148 (3) ◽

pp. 243-250 ◽

Cited By ~ 9

Author(s):

K.G. Germanova ◽

E.P. Valcheva

Keyword(s):

Electrical Properties ◽

Chemical Vapour Deposition ◽

Vapour Deposition ◽

Chemical Vapour ◽

Metal Insulator ◽

Metal Insulator Semiconductor ◽

Semiconductor Structures

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Electrical properties of metal-insulator-metal and metal-insulator-semiconductor structures containing Langmuir-Blodgett insulating multilayers

Thin Solid Films ◽

10.1016/0040-6090(89)90173-9 ◽

1989 ◽

Vol 179 (1-2) ◽

pp. 121-127 ◽

Cited By ~ 12

Author(s):

F Kaneko ◽

M Shibata ◽

Y Inaba ◽

S Kobayashi

Keyword(s):

Electrical Properties ◽

Metal Insulator ◽

Metal Insulator Semiconductor ◽

Langmuir Blodgett ◽

Semiconductor Structures ◽

Metal Insulator Metal

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The forming process in resistive-memory elements based on metal-insulator-semiconductor structures

Technical Physics Letters ◽

10.1134/s1063785014100137 ◽

2014 ◽

Vol 40 (10) ◽

pp. 837-840 ◽

Cited By ~ 8

Author(s):

S. V. Tikhov ◽

O. N. Gorshkov ◽

I. N. Antonov ◽

A. P. Kasatkin ◽

M. N. Koryazhkina

Keyword(s):

Resistive Memory ◽

Forming Process ◽

Metal Insulator ◽

Metal Insulator Semiconductor ◽

Semiconductor Structures

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