Electrical characteristics of metal-insulator-semiconductor structures with atomic layer deposited Al2O3, HfO2, and nanolaminates on different silicon substrates
2011 ◽
Vol 29
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pp. 01AA07
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1992 ◽
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pp. 3125-3130
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pp. 01A128
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2019 ◽
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1992 ◽
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