Spectroscopic ellipsometry study of hydrogenated amorphous silicon carbon alloy films deposited by plasma enhanced chemical vapor deposition

2010 ◽  
Vol 107 (2) ◽  
pp. 023502 ◽  
Author(s):  
D. K. Basa ◽  
G. Abbate ◽  
G. Ambrosone ◽  
U. Coscia ◽  
A. Marino
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