Spectroscopic ellipsometry study of hydrogenated amorphous silicon carbon alloy films deposited by plasma enhanced chemical vapor deposition
2000 ◽
Vol 39
(Part 1, No. 11)
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pp. 6196-6201
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1999 ◽
Vol 17
(6)
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pp. 3240-3245
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2007 ◽
Vol 154
(5)
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pp. G122
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2007 ◽
Vol 46
(1)
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pp. 56-59
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2008 ◽
Vol 69
(2-3)
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pp. 648-652
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