Hot-carrier-induced modifications to the noise performance of polycrystalline silicon thin-film transistors

1997 ◽  
Vol 71 (9) ◽  
pp. 1216-1218 ◽  
Author(s):  
S. Giovannini ◽  
R. Carluccio ◽  
L. Mariucci ◽  
A. Pecora ◽  
G. Fortunato ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Noise Performance ◽  
Silicon Thin Film ◽  
Hot Carrier

Anomalous hot-carrier-induced degradation of offset gated polycrystalline silicon thin-film transistors

2004 ◽  
Vol 84 (16) ◽  
pp. 3163-3165
Author(s):  
A. Hatzopoulos ◽  
C. A. Dimitriadis ◽  
G. Pananakakis ◽  
G. Ghibaudo ◽  
G. Kamarinos
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Silicon Thin Film ◽  
Hot Carrier

scholarly journals Enhanced degradation in polycrystalline silicon thin-film transistors under dynamic hot-carrier stress

2001 ◽  
Vol 22 (10) ◽  
pp. 475-477 ◽  
Author(s):  
Kow Ming Chang ◽  
Yuan Hung Chung ◽  
Gin Ming Lin ◽  
Chi Gun Deng ◽  
Jian Hong Lin
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Silicon Thin Film ◽  
Hot Carrier ◽  
Hot Carrier Stress ◽  
Enhanced Degradation
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